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Deformation and Fracture of Solid-State Materials - Sanichiro Yoshida

Deformation and Fracture of Solid-State Materials

Field Theoretical Approach and Engineering Applications
Buch | Softcover
243 Seiten
2016 | Softcover reprint of the original 1st ed. 2015
Springer-Verlag New York Inc.
978-1-4939-5502-2 (ISBN)
CHF 149,75 inkl. MwSt
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This volume introduces a comprehensive theory of deformation and fracture to engineers and applied scientists. Here “comprehensive” means that the theory can describe all stages of deformation from elastic to plastic and plastic to fracturing stage on the same basis (equations). The comprehensive approach is possible because the theory is based on a fundamental physical principle called the local symmetry, or gauge invariance, as opposed to phenomenology.

Professor Yoshida explains the gist of local symmetry (gauge invariance) intuitively so that engineers and applied physicists can digest it easily, rather than describing physical or mathematical details of the principle. The author also describes applications of the theory to practical engineering, such as nondestructive testing in particular, with the use of an optical interferometric technique called ESPI (Electronic Speckle-Pattern Interferometry).The book is not a manual of applications. Instead, it provides information on how to apply physical concepts to engineering applications.

Introduction.- Quick Review of Theories of Elastic Deformation.-Quick Review of Field Theories.-  Field Theory of Deformation and Fracture.- Interpretations of Deformation and Fracture Phenomena from Field Theoretical Viewpoint.-  Optical Interferometry and Application to Material Characterization.- Experimental Observations.- Applications.

Erscheinungsdatum
Zusatzinfo 79 Illustrations, color; 39 Illustrations, black and white; XI, 243 p. 118 illus., 79 illus. in color.
Verlagsort New York
Sprache englisch
Maße 155 x 235 mm
Themenwelt Mathematik / Informatik Mathematik Wahrscheinlichkeit / Kombinatorik
Technik Maschinenbau
Schlagworte Deformation analysis • Electronic Speckle Pattern Interferometry • Field Theory • Gauge Invariance • Nondestructive Testing
ISBN-10 1-4939-5502-0 / 1493955020
ISBN-13 978-1-4939-5502-2 / 9781493955022
Zustand Neuware
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