Advances in Imaging and Electron Physics (eBook)

Peter W. Hawkes (Autor)

eBook Download: PDF

2004 | 1. Auflage
315 Seiten
Elsevier Science (Verlag)
978-0-08-049326-8 (ISBN)

Infos

"The subjects reviewed in the 'Advances' series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics.

Several of these topics are covered in this volume, which opens with a long
chapter of monograph stature on quantitative electron microscopy at the
atomic resolution level by scientists from a well-known and very
distinguished Antwerp University Laboratory. This is unique in that the
statistical aspects are explored fully. This is followed by a contribution
by A.M. Grigoryan and S.S. Again on transform-based image enhancement,
covering both frequency-ordered systems and tensor approaches. The volume
concludes with an account of the problems of image registration and ways of
solving them by Maria Petrou of the University of Surrey, feature detection,
related image transforms and quality measures are examined separately.

The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading.

?Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics
?Presents theory and it's application in a practical sense, providing long awaited solutions and new findings
?Provides a comprehensive overview of international congress proceedings and associated publications, as source material."

---

The subjects reviewed in the Advances in Imaging and Electron Physics series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics. Several of these topics are covered in this volume, which opens with a long chapter of monograph stature on quantitative electron microscopy at the atomic resolution level by scientists from a well-known and very distinguished Antwerp University Laboratory. This is unique in that the statistical aspects are explored fully. This is followed by a contribution by A.M. Grigoryan and S.S. Again on transform-based image enhancement, covering both frequency-ordered systems and tensor approaches. The volume concludes with an account of the problems of image registration and ways of solving them by Maria Petrou of the University of Surrey; feature detection, related image transforms and quality measures are examined separately. The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading. - Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics- Presents theory and it's application in a practical sense, providing long awaited solutions and new findings- Provides a comprehensive overview of international congress proceedings and associated publications, as source material

Inhalt

Cover 1
Contents 6
Contributors 8
Preface 10
Future Contributions 12
Chapter 1. Statistical Experimental Design for Quantitative Atomic Resolution Transmission Electron Microscopy 18
I. Introduction 19
II. Basic Principles of Statistical Experimental Design 30
III. Statistical Experimental Design of Atomic Resolution Transmission Electron Microscopy Using Simplified Models 44
IV. Optimal Statistical Experimental Design of Conventional Transmission Electron Microscopy 75
V. Optimal Statistical Experimental Design of Scanning Transmission Electron Microscopy 121
VI. Discussion and Conclusions 160
References 174
Chapter 2. Transform-Based Image Enhancement Algorithms with Performance Measure 182
I. Introduction 182
II. Transforms with Frequency Ordered Systems 187
III. Tensor Method of Image Enhancement 235
References 257
Chapter 3. Image Registration: An Overview 260
I. Introduction 260
II. Similarity Measures 263
III. Deriving the Transformation Between the Two Images 283
IV. Feature Extraction 293
V. Literature Survey 299
VI. Conclusions 304
References 305
Index 310

Produkt-Details

• Erscheint lt. Verlag: 26.5.2004
• Sprache: englisch
• Themenwelt: Sachbuch/Ratgeber
• Themenwelt: Mathematik / Informatik ► Informatik
• Themenwelt: Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik
• Themenwelt: Naturwissenschaften ► Physik / Astronomie ► Elektrodynamik
• Themenwelt: Technik ► Bauwesen
• Themenwelt: Technik ► Elektrotechnik / Energietechnik
• Themenwelt: Technik ► Maschinenbau
• ISBN-10: 0-08-049326-2 / 0080493262
• ISBN-13: 978-0-08-049326-8 / 9780080493268