Positron Annihilation in Semiconductors

Defect Studies

Reinhard Krause-Rehberg, Hartmut S. Leipner (Autoren)

Buch | Hardcover

XV, 383 Seiten

1999
Springer Berlin (Verlag)
9783540643715 (ISBN)

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The subject of this book is the investigation of lattice imperfections in semiconductors by means of positron annihilation. A comprehensive review is given of the different positron techniques, whose application to various kinds of defects, e.g. vacancies, impurity-vacancy complexes and dislocations, is described. The sensitivity range of positron annihilation with respect to the detection of these defects is compared to that of other defect-sensitive methods. The most prominent results obtained with positrons in practically all important semiconductors are reviewed. A special chapter of the book deals with positron annihilation as a promising tool for many technological purposes. The theoretical background necessary to understand the experimental results is explained in detail.

1 Introduction.- 2 Experimental Techniques.- 3 Basics of Positron Annihilation in Semiconductors.- 4 Defect Characterization in Elemental Semiconductors.- 5 Defect Characterization in III V Compounds.- 6 Defect Characterization in II VI Compounds.- 7 Defect Characterization in Other Compounds.- 8 Applications of Positron Annihilation in Defect Engineering.- 9 Comparison of Positron Annihilation with Other Defect-Sensitive Techniques.- A1 Semiconductor Data.- A2 Trapping Model Equations.- References.

Erscheint lt. Verlag	21.1.1999
Reihe/Serie	Springer Series in Solid-State Sciences
Zusatzinfo	XV, 383 p. 121 illus.
Verlagsort	Berlin
Sprache	englisch
Gewicht	674 g
Themenwelt	Naturwissenschaften ► Chemie ► Analytische Chemie
	Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik
	Naturwissenschaften ► Physik / Astronomie ► Festkörperphysik
Schlagworte	annihilation • compounds • defects • Halbleiterphysik • positron • Positronen • semiconductors • vacancies
ISBN-13	9783540643715 / 9783540643715
Zustand	Neuware