Positron Annihilation in Semiconductors
Springer Berlin (Verlag)
978-3-642-08403-4 (ISBN)
The book is written not only for specialists in positron annihilation but for all scientists, technicians, and students who are interested in defects in semiconductors. It explains in detail the theoretical basics necessary to understand the experimental results presented.
1 Introduction.- 2 Experimental Techniques.- 3 Basics of Positron Annihilation in Semiconductors.- 4 Defect Characterization in Elemental Semiconductors.- 5 Defect Characterization in III V Compounds.- 6 Defect Characterization in II VI Compounds.- 7 Defect Characterization in Other Compounds.- 8 Applications of Positron Annihilation in Defect Engineering.- 9 Comparison of Positron Annihilation with Other Defect-Sensitive Techniques.- A1 Semiconductor Data.- A2 Trapping Model Equations.- References.
Erscheint lt. Verlag | 1.12.2010 |
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Reihe/Serie | Springer Series in Solid-State Sciences |
Zusatzinfo | XV, 383 p. 121 illus. |
Verlagsort | Berlin |
Sprache | englisch |
Maße | 155 x 235 mm |
Gewicht | 600 g |
Themenwelt | Naturwissenschaften ► Chemie ► Analytische Chemie |
Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik | |
Naturwissenschaften ► Physik / Astronomie ► Festkörperphysik | |
Schlagworte | annihilation • compounds • defects • positron • semiconductors • vacancies |
ISBN-10 | 3-642-08403-6 / 3642084036 |
ISBN-13 | 978-3-642-08403-4 / 9783642084034 |
Zustand | Neuware |
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