Modern Interferometry for Length Metrology (eBook)

Exploring limits and novel techniques

René Schödel (Herausgeber)

eBook Download: EPUB

2018
350 Seiten
Institute of Physics Publishing (Verlag)
978-0-7503-1578-4 (ISBN)

Infos

Modern Interferometry for Length
Metrology: Exploring limits and novel techniques gives an overview of refined
traditional methods and novel techniques in the field of length and distance
metrology. Within the book advanced solutions, which can be used for various applications and can help provide a comprehensive
understanding of both metrology and interferometry, have been developed and discussed.

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Modern Interferometry for Length
Metrology: Exploring limits and novel techniques gives an overview of refined
traditional methods and novel techniques in the field of length and distance
metrology. The representation of a length according to the definition of the
meter in the International System of Units (SI) requires a measurement principle
that establishes a relation between the travelling time of light in vacuum and
the length to be measured. This comprehensive book covers the basic concepts of
length metrology, sophisticated methods to reach smallest measurement
uncertainties in length measurements and innovative interferometer
concepts. Aimed at students, researchers and practitioners in the field, this
book will provide a far-reaching audience with key data, enabling them to better apply and understand interferometry and length
metrology.

Autoren

René Schӧdel is the head of the Department of Interferometry on Material Measures at the Physikalisch-Technische Bundesanstalt (PTB), and is highly engaged in fields of optical interferometry and length metrology. Other contributors to the work are Florian Pollinger, Arnold Nicolaus, Guido Bartl, Thilo Schuldt, Nandini Bhattacharya, Steven van den Berg, Seung-Woo Kim, Yoon-Soo Jang, Armin Reichhold, Birk Andreas and Christoph Weichert.

Modern Interferometry for Length Metrology: Exploring limits and novel techniques has been written by leading experts within the field of metrology and edited by René Schӧdel who is the head of the Department of Interferometry on Material Measures at the Physikalisch-Technische Bundesanstalt (PTB). Schӧdel is highly engaged in fields of optical interferometry and length metrology, and he has contributed significant findings and practical applications to this book along with the co-authors. Contributing their expert knowledge to the work are Florian Pollinger, Arnold Nicolaus, Guido Bartl, Thilo Schuldt, Nandini Bhattacharya, Steven van den Berg, Seung-Woo Kim, Yoon-Soo Jang, Armin Reichhold, Birk Andreas and Christoph Weichert.

Inhalt

Chapter 1 - Practical
realization of the length by interferometry - General principles and

Limitations

Chapter 2 -
Large field imaging interferometry for the measurement of the length of bar

shaped
material measures

Chapter 3 -
Fizeau Interferometry for the sub-nm accurate realization of sphere radii

Chapter 4 - Interferometry
for distance metrology in space

Chapter 5 -
Interferometry in air with refractive index compensation

Chapter 6 -
Frequency-comb-based spectral interferometry and homodyne many-wavelength interferometry
for distance measurements

Chapter 7 - Absolute
distance measurement based on dispersive/spectral domain

interferometry
and dual comb interferometry

Chapter 8 -
Frequency- scanning interferometry-based distance metrology

Chapter 9 - pm-level
distance interferometry

Produkt-Details

• Erscheint lt. Verlag: 21.12.2018
• Reihe/Serie: IOP Expanding Physics
• Reihe/Serie: IOP Expanding Physics
• Reihe/Serie: ISSN
• Reihe/Serie: ISSN
• Co-Autor: Florian Pollinger, Arnold Nicolaus, Guido Bartl, Thilo Schuldt, Nandini Bhattacharya, Steven van den Berg, Seung-Woo Kim, Yoon-Soo Jang, Armin Reichhold, Birk Andreas, Christoph Weichert
• Zusatzinfo: With figures in colour and black and white
• Verlagsort: Bristol
• Sprache: englisch
• Maße: 180 x 180 mm
• Themenwelt: Naturwissenschaften
• Schlagworte: Imaging Interferometry, distance metrology, pulse-to-pulse, two-color interferometry, spectral domain interferometry
• ISBN-10: 0-7503-1578-4 / 0750315784
• ISBN-13: 978-0-7503-1578-4 / 9780750315784