Magnetic Microscopy of Layered Structures
Seiten
2016
|
1. Softcover reprint of the original 1st ed. 2015
Springer Berlin (Verlag)
978-3-662-51776-5 (ISBN)
Springer Berlin (Verlag)
978-3-662-51776-5 (ISBN)
This book presents the important analytical technique of magnetic microscopy. This method is applied to analyze layered structures with high resolution. This book presents a number of layer-resolving magnetic imaging techniques that have evolved recently. Many exciting new developments in magnetism rely on the ability to independently control the magnetization in two or more magnetic layers in micro- or nanostructures. This in turn requires techniques with the appropriate spatial resolution and magnetic sensitivity. The book begins with an introductory overview, explains then the principles of the various techniques and gives guidance to their use. Selected examples demonstrate the specific strengths of each method. Thus the book is a valuable resource for all scientists and practitioners investigating and applying magnetic layered structures.
Photoelectron Emission Microscopy Using X-Ray Circular Magnetic Dichroism.- Imaging Antiferromagnetic Domains by Photoelectron Emission Microscopy.- Transmission X-Ray Microscopy for the Element-Resolved Imaging of Magnetic Domains.- Layer-Sensitive Magneto-Optical Kerr Effect Microscopy.
| Erscheinungsdatum | 29.08.2016 |
|---|---|
| Reihe/Serie | Springer Series in Surface Sciences |
| Zusatzinfo | XI, 246 p. 112 illus., 6 illus. in color. |
| Verlagsort | Berlin |
| Sprache | englisch |
| Maße | 155 x 235 mm |
| Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik |
| Naturwissenschaften ► Physik / Astronomie ► Elektrodynamik | |
| Schlagworte | Characterization and Evaluation of Materials • Electricity, electromagnetism and magnetism • Engineering, general • Engineering: general • Layered structures • Magnetic domain imaging • Magnetic thin films and multilayers • Magnetism, Magnetic Materials • Materials Science • Micromagnetism • Microscopy • Physics and Astronomy • Surface chemistry and adsorption • Surfaces and Interfaces, Thin Films • Testing of materials |
| ISBN-10 | 3-662-51776-0 / 3662517760 |
| ISBN-13 | 978-3-662-51776-5 / 9783662517765 |
| Zustand | Neuware |
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