Scanning Tunneling Microscopy II

Further Applications and Related Scanning Techniques

Roland Wiesendanger, Hans-Joachim Güntherodt (Herausgeber)

Buch | Softcover

XIV, 349 Seiten

1995 | 2. Softcover reprint of the original 2nd ed. 1995
Springer Berlin (Verlag)
978-3-540-58589-3 (ISBN)

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Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and the broad range of applications of STM and related scanning probe techniques. The applications discussed in this volume come predominantly from the fields of electrochemistry and biology. In contrast to those in STM I, these studies may be performed in air and in liquids. The extensions of the basic technique to map other interactions are described in chapters on scanning force microscopy, magnetic force microscopy, and scanning near-field optical microscopy, together with a survey of other related techniques. Also discussed here is the use of a scanning proximal probe for surface modification. Together, the two volumes give a comprehensive account of experimental aspects of STM and provide essential reading and reference material. In this second edition the text has been updated and new methods are discussed.

1. Introduction.- 1.1 STM in Electrochemistry and Biology.- 1.2 Probing Small Forces on a Small Scale.- 1.3 Related Scanning Probe Microscopies.- 1.4 Nanotechnology.- References.- 2. STM in Electrochemistry.- 2.1 Principal Aspects.- 2.2 Experimental Concepts for Electrolytic STM at Potential-Controlled Electrodes.- 2.3 Electrochemical Applications of In Situ STM at Potential-Controlled Electrodes.- 2.4 Outlook.- References.- 3. The Scanning Tunneling Microscope in Biology.- 3.1 Instrumentation.- 3.2 Processing of STM Images.- 3.3 Preparation.- 3.4 Applications.- 3.5 Imaging and Conduction Mechanisms.- 3.6 Conclusions.- References.- 4. Scanning Force Microscopy (SFM).- 4.1 Experimental Aspects of Force Microscopy.- 4.2 Forces and Their Relevance to Force Microscopy.- 4.3 Microscopic Description of the Tip-Sample Contact.- 4.4 Imaging with the Force Microscope.- 4.5 Conclusions and Outlook.- References.- 5. Magnetic Force Microscopy (MFM).- 5.1 Basic Principles of MFM.- 5.2 Measurement Techniques.- 5.3 Force Sensors.- 5.4 Theory of MFM Response.- 5.5 Imaging Data Storage Media.- 5.6 Imaging Soft Magnetic Materials.- 5.7 Resolution.- 5.8 Separation of Magnetic and Topographic Signals.- 5.9 Comparison with Other Magnetic Imaging Techniques.- 5.10 Conclusions and Outlook.- References.- 6. Related Scanning Techniques.- 6.1 Historical Background.- 6.2 STM and Electrical Measurements.- 6.3 STM and Optical Effects.- 6.4 Near-Field Thermal Microscopy.- 6.5 Scanning Force Microscopy and Extensions.- 6.6 Conclusion.- References.- 7. Nano-optics and Scanning Near-Field Optical Microscopy.- 7.1 Nano-optics: Optics of Nanometer-Size Structures.- 7.2 Experimental Work.- 7.3 Plasmons and Spectroscopic Effects.- 7.4 Imaging by SNOM.- 7.5 Discussion, Outlook, Conclusions.- References.- 8.Surface Modification with a Scanning Proximity Probe Microscope.- 8.1 Overview.- 8.2 Microfabrication with a Scanning Probe Microscope.- 8.3 Investigation of the Fabrication Process.- 8.4 Review of SXM Lithography.- 9. Recent Developments.- 9.1 STM and SFM in Electrochemistry.- 9.2 STM in Biology.- 9.3 Scanning-Force Microscopy.- 9.4 Nano-Optics and Scanning Near-Field Optical Microscopy: New Developments.- 9.5 Surface Modifications by Scanning-Probe Methods.- References.

Erscheint lt. Verlag	4.8.1995
Reihe/Serie	Springer Series in Surface Sciences
Co-Autor	W. Baumeister, P. Grütter, R. Guckenberger, H.-J. Güntherodt, T. Hartmann, H. Heinzelmann, H.F. Knapp, H.J. Mamin, E. Meyer, D.W. Pohl, D. Rugar, H. Siegenthaler, U. Staufer, H.K. Wickramasinghe, W. Wiegräbe, R. Wiesendanger
Zusatzinfo	XIV, 349 p. 91 illus., 2 illus. in color.
Verlagsort	Berlin
Sprache	englisch
Maße	155 x 235 mm
Gewicht	546 g
Themenwelt	Naturwissenschaften ► Chemie ► Analytische Chemie
	Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik
	Naturwissenschaften ► Physik / Astronomie ► Festkörperphysik
Schlagworte	Chemistry • Design • Dynamics • Electronics • Environment • Influence • Modeling • nanotechnology • Optics • quality • Rastertunnelmikroskopie • Scanning Probe Microscopy • Sensor • Simulation • spectroscopy • Surface Science
ISBN-10	3-540-58589-3 / 3540585893
ISBN-13	978-3-540-58589-3 / 9783540585893
Zustand	Neuware