Scanning Tunneling Microscopy II

Further Applications and Related Scanning Techniques

Roland Wiesendanger, Hans-Joachim Güntherodt (Herausgeber)

Buch | Softcover

XIV, 308 Seiten

2012 | 1. Softcover reprint of the original 1st ed. 1992
Springer Berlin (Verlag)
978-3-642-97365-9 (ISBN)

Infos

Scanning Tunneling Microscopy II, like its predecessor,presents detailed and comprehensive accounts of the basicprinciples and broad range of applications of STM andrelated scanning probe techniques. The applicationsdiscussed in this volume come predominantly from the fieldsof electrochemistry and biology. In contrast to thosedescribed in Vol. I, these sudies may be performed in airand in liquids. The extensions of the basic technique tomap other interactions are described inchapters on scanningforce microscopy, magnetic force microscopy, scanningnear-field optical microscopy, together with a survey ofother related techniques. Also described here is the use ofa scanning proximal probe for surface modification.Togehter, the two volumes give a comprehensive account ofexperimental aspcets of STM. They provide essentialreadingand reference material for all students and researchersinvolvedin this field.

Autor

Scanning tunneling microscopy is a fascinating imaging technique that can produce stunning pictures of both inanimate and biological materials. This book is the second of three volumes that together provide the first ever comprehensive introduction to, and review of, this important and rapidly expanding field.

Inhalt

1. Introduction.- 1.1 STM in Electrochemistry and Biology.- 1.2 Probing Small Forces on a Small Scale.- 1.3 Related Scanning Probe Microscopies.- 1.4 Nanotechnology.- References.- 2. STM in Electrochemistry.- 2.1 Principal Aspects.- 2.2 Experimental Concepts for Electrolytic STM at Potential-Controlled Electrodes.- 2.3 Electrochemical Applications of In Situ STM at Potential-Controlled Electrodes.- 2.4 Outlook.- References.- 3. The Scanning Tunneling Microscope in Biology.- 3.1 Instrumentation.- 3.2 Processing of STM Images.- 3.3 Preparation.- 3.4 Applications.- 3.5 Imaging and Conduction Mechanisms.- 3.6 Conclusions.- References.- 4. Scanning Force Microscopy (SFM).- 4.1 Experimental Aspects of Force Microscopy.- 4.2 Forces and Their Relevance to Force Microscopy.- 4.3 Microscopic Description of the Tip-Sample Contact.- 4.4 Imaging with the Force Microscope.- 4.5 Conclusions and Outlook.- References.- 5. Magnetic Force Microscopy (MFM).- 5.1 Basic Principles of MFM.- 5.2 Measurement Techniques.- 5.3 Force Sensors.- 5.4 Theory of MFM Response.- 5.5 Imaging Data Storage Media.- 5.6 Imaging Soft Magnetic Materials.- 5.7 Resolution.- 5.8 Separation of Magnetic and Topographic Signals.- 5.9 Comparison with Other Magnetic Imaging Techniques.- 5.10 Conclusions and Outlook.- References.- 6. Related Scanning Techniques.- 6.1 Historical Background.- 6.2 STM and Electrical Measurements.- 6.3 STM and Optical Effects.- 6.4 Near-Field Thermal Microscopy.- 6.5 Scanning Force Microscopy and Extensions.- 6.6 Conclusion.- References.- 7. Nano-optics and Scanning Near-Field Optical Microscopy.- 7.1 Nano-optics: Optics of Nanometer-Size Structures.- 7.2 Experimental Work.- 7.3 Plasmons and Spectroscopic Effects.- 7.4 Imaging by SNOM.- 7.5 Discussion, Outlook, Conclusions.- References.-8. Surface Modification with a Scanning Proximity Probe Microscope.- 8.1 Overview.- 8.2 Microfabrication with a Scanning Probe Microscope.- 8.3 Investigation of the Fabrication Process.- 8.4 Review of SXM Lithography.- References.

Produkt-Details

• Erscheint lt. Verlag: 12.2.2012
• Reihe/Serie: Springer Series in Surface Sciences
• Co-Autor: W. Baumeister, P. Grütter, R. Guckenberger, Hans-Joachim Güntherodt, T. Hartmann, H. Heinzelmann, H.J. Mamin, E. Meyer, D.W. Pohl, D. Rugar, H. Siegenthaler, U. Staufer, H.K. Wickramasinghe, W. Wiegräbe, Roland Wiesendanger
• Zusatzinfo: XIV, 308 p.
• Verlagsort: Berlin
• Sprache: englisch
• Maße: 155 x 235 mm
• Gewicht: 492 g
• Themenwelt: Naturwissenschaften ► Chemie ► Analytische Chemie
• Themenwelt: Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik
• Themenwelt: Naturwissenschaften ► Physik / Astronomie ► Festkörperphysik
• Schlagworte: Chemistry • nanotechnology • Scanning Probe Microscopies • Scanning Tunneling Microscopy • Surface Science
• ISBN-10: 3-642-97365-5 / 3642973655
• ISBN-13: 978-3-642-97365-9 / 9783642973659
• Zustand: Neuware