Surface and Interface Characterization by Electron Optical Methods

Buch | Softcover

319 Seiten

2012
Springer-Verlag New York Inc.
978-1-4615-9539-7 (ISBN)

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The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident. To join the expertise of the tradi tional surface scientist with that of the electron microscopist has however been a slow and difficult process. In the past few years remarkable progress has been achieved, including the development of new techniques of scanning transmission and reflection imaging as well as low energy microscopy, all carried out in greatly improved vacuum conditions. Most astonishing of all has been the advent of the scanning tunneling electron microscope providing atomic resolution in a manner readily compatible with most surface science diagnostic procedures. The problem of beam damage, though often serious, is increasingly well understood so that we can assess the reliability and usefulness of the results which can now be obtained in catalysis studies and a wide range of surface science applications. These new developments and many others in more established surface techniques are all described in this book, based on lectures given at a NATO Advanced Study Institute held in Erice, Sicily, at Easter 1987. It is regretted that a few lectures on low energy electron diffraction and channeling effects could not be included. Fifteen lecturers from seven different Countries and 67 students from 23 Countries and a wide variety of backgrounds attended the school.

Principles and techniques of transmission imaging of surfaces.- Catalyst studies by scanning transmission electron microscopy.- Localised surface imaging and spectroscopy in the scanning transmission electron microscope.- Fundamentals of high resolution transmission electron microscopy.- Profile imaging of small particles, extended surfaces and dynamic surface phenomena.- Transmission electron microscopy and diffraction from semiconductor interfaces and surfaces.- The transmission electron microscopy of interfaces and multilayers.- Surface microanalysis and microscopy by X-ray photoelectron spectroscopy (XPS), core-loss spectroscopy (CLS) and Auger electron spectroscopy (AES).- Reflection electron microscopy.- An introduction to reflection high energy electron diffraction.- Intensity oscillations in reflection high energy electron diffraction during epitaxial growth.- Emission and low energy reflection electron microscopy.- Scanning tunneling microscopy and spectroscopy.- Spin-polarized secondary electrons from ferromagnets.- Electronically stimulated desorption: mechanisms, applications and implications.- Structure and catalytic activity of surfaces.

Erscheint lt. Verlag	25.11.2012
Reihe/Serie	Nato ASI Subseries B: ; 16
Zusatzinfo	VIII, 319 p.
Verlagsort	New York, NY
Sprache	englisch
Themenwelt	Naturwissenschaften ► Chemie ► Analytische Chemie
	Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik
	Naturwissenschaften ► Physik / Astronomie ► Festkörperphysik
ISBN-10	1-4615-9539-8 / 1461595398
ISBN-13	978-1-4615-9539-7 / 9781461595397
Zustand	Neuware