Nicht aus der Schweiz? Besuchen Sie lehmanns.de
GIS and Statistical Analysis with Arcview - J. Lee, David Wong

GIS and Statistical Analysis with Arcview

, (Autoren)

Buch | Hardcover
208 Seiten
2000
John Wiley & Sons Inc (Verlag)
978-0-471-34874-0 (ISBN)
CHF 123,85 inkl. MwSt
zur Neuauflage
  • Titel erscheint in neuer Auflage
  • Artikel merken
Zu diesem Artikel existiert eine Nachauflage
This work brings the traditional tools of quantitative geography into the GIS environment. It uses the popular ArcView software to teach professionals and students alike how to apply established statistical techniques.
Statistical techniques for dealing with quantitative data are important tools for every geographer. This is the first book to bring the traditional tools of quantitative geography into the GIS environment. Up to this point, existing books have relied on older software not widely found in a geography context. This brand new resource teaches professionals and students alike how to use their software in applying established statistical techniques.

Jay Lee, PhD, is Associate Professor of Geography at Kent State University in Ohio and served as associate editor of the Wiley journal, Applied Geographic Studies. David W.S. Wong, PhD, is Associate Professor of Earth Sciences at George Mason University in Fairfax, Virginia.

1. Attribute Descriptors; 1.1 Central Tendency; 1.2 Dispersion and Distribution; 1.3 Relationship; 1.4 Trend; 2. Point Descriptors; 2.1 The Nature of Point Features; 2.2 Central Tendency of Point Distributions; 2.3 Dispersion of Point Distributions; 2.4 Application Examples; 2.4.1 References; 3. Pattern Detectors; 3.1 Scale, Extent, and Projection; 3.2 Quadrat Analysis; 3.3 Nearest Neighbor Analysis; 3.4 Spatial Autocorrelation; 3.5 Application Examples; 3.5.1 References; 4. Line Descriptors; 4.1 The Nature of Linear Features; 4.2 Characteristics and Attributes of Linear Features; 4.3 Directional Statistics; 4.4 Network Analysis; 4.5 Application Examples; 4.5.1 References; 5. Pattern Descriptors; 5.1 Spatial Relationships; 5.2 Spatial Autocorrelation; 5.3 Spatial Weights Matrices; 5.4 Types of Spatial Autocorrelation Measures and Some Notations; 5.5 Joint Count Statistics; 5.6 Moran and Geary Indices; 5.7 General G-Statistic; 5.8 Local Spatial Autocorrelation Statistics; 5.9 Moran Scatterplot; 5.10 Application Examples; 5.11 Summary; 5.11.1 References; Index

Erscheint lt. Verlag 16.1.2001
Zusatzinfo Illustrations, maps
Verlagsort New York
Sprache englisch
Maße 160 x 240 mm
Gewicht 397 g
Themenwelt Mathematik / Informatik Mathematik Computerprogramme / Computeralgebra
Naturwissenschaften Geowissenschaften Geografie / Kartografie
ISBN-10 0-471-34874-0 / 0471348740
ISBN-13 978-0-471-34874-0 / 9780471348740
Zustand Neuware
Informationen gemäß Produktsicherheitsverordnung (GPSR)
Haben Sie eine Frage zum Produkt?
Mehr entdecken
aus dem Bereich