Software Reliability Growth Models
Springer Verlag, Singapore
978-981-16-0027-2 (ISBN)
David D. Hanagal is Honorary Professor at Symbiosis Statistical Institute, Symbiosis International University, Pune, India. He was previously Professor at the Department of Statistics, Savitribai Phule Pune University, India. He is an elected fellow of the Royal Statistical Society, UK. He has authored three books and three book chapters and published over 130 research publications in leading international refereed journals. He has guided 9 Ph.D. students in different areas of statistics, namely reliability, survival analysis, frailty models, repair and replacement models, software reliability, and quality loss index. He also has worked as Visiting Professor at several universities in the USA, Germany, and Mexico, and delivered more than 100 invited talks in many national and international platforms of repute worldwide. He is Editor-in-Chief, Associate Editor, and an editorial board member of several reputed national and international journals. He is the chairperson, the subject expert, and an advisory committee member on several UGC committees. He is a National Assessment and Accreditation Council (NAAC) Assessor from UGC. He is the subject expert (statistics) in board of studies committee of several universities. He is a governing council member, an executive council member, and a life member of several statistical societies, organizations, and associations. His research interests include statistical inference, selection problems, reliability, survival analysis, frailty models, Bayesian inference, stress–strength models, Monte–Carlo methods, MCMC algorithms, bootstrapping, censoring schemes, distribution theory, multivariate models, characterizations, repair and replacement models, software reliability, quality loss index, and nonparametric inference. With more than 40 years of teaching experience and more than 35 years of research experience, he is an expert on writing programs using SAS, R, MATLAB, MINITAB, SPSS, and SPLUS statistical packages. Nileema N. Bhalerao is Assistant Professor at Fergusson College, Pune, India. With 20 years of teaching experience and 5 years of research experience, she is an expert on writing programs using several statistical packages. Her research interest includes software reliability models.
1. Introduction to Software Reliability Models.- 2. Literature Survey in Software Reliability Growth Models.- 3. NHPP Software Reliability Growth Models.- 4. Inverse Weibull Software Reliability Growth Model.- 5. Generalized Inverse Weibull Software Reliability Growth Model.- 6. Extended Inverse Weibull Software Reliability Growth Model.- 7. Generalized Extended Inverse Weibull Software Reliability Growth Model.- 8. Delayed S-Shaped SRGM with Time Dependent Fault Content Rate Function.- 9. Scope for Future Extension to SRGM.
| Erscheinungsdatum | 04.03.2022 |
|---|---|
| Reihe/Serie | Infosys Science Foundation Series | Infosys Science Foundation Series in Mathematical Sciences |
| Zusatzinfo | 40 Illustrations, black and white; XXI, 104 p. 40 illus. |
| Verlagsort | Singapore |
| Sprache | englisch |
| Maße | 155 x 235 mm |
| Themenwelt | Mathematik / Informatik ► Mathematik ► Wahrscheinlichkeit / Kombinatorik |
| Schlagworte | delayed s-shaped curve • extended inverse Weibull • fault content rate function • generalized extended inverse Weibull • generalized inverse Weibull • Hazard Rate • imperfect debugging • inverse Weibull • mean value function • model selection criteria • Non-Homogeneous Poisson Process • predictive risk ratio |
| ISBN-10 | 981-16-0027-9 / 9811600279 |
| ISBN-13 | 978-981-16-0027-2 / 9789811600272 |
| Zustand | Neuware |
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