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Integrated Imaging and Vision Techniques for Industrial Inspection (eBook)

Advances and Applications
eBook Download: PDF
2015 | 1st ed. 2015
X, 541 Seiten
Springer London (Verlag)
978-1-4471-6741-9 (ISBN)

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This pioneering text/reference presents a detailed focus on the use of machine vision techniques in industrial inspection applications. An internationally renowned selection of experts provide insights on a range of inspection tasks, drawn from their cutting-edge work in academia and industry, covering practical issues of vision system integration for real-world applications. Topics and features: presents a comprehensive review of state-of-the-art hardware and software tools for machine vision, and the evolution of algorithms for industrial inspection; includes in-depth descriptions of advanced inspection methodologies and machine vision technologies for specific needs; discusses the latest developments and future trends in imaging and vision techniques for industrial inspection tasks; provides a focus on imaging and vision system integration, implementation, and optimization; describes the pitfalls and barriers to developing successful inspection systems for smooth and efficient manufacturing process.

Dr. Zheng Liu is an Associate Professor at the University of British Columbia, Kelowna, BC, Canada. Dr. Hiroyuki Ukida is an Associate Professor in the Institute of Technology and Science at the University of Tokushima, Japan. Dr. Pradeep Ramuhalli is a Senior Research Scientist at the Pacific Northwest National Laboratory, Richland, WA, USA. Dipl.-Ing. Kurt Niel is the Head of the Department of Metrology and Control Engineering at the University of Applied Sciences Upper Austria, Wels, Austria.


This pioneering text/reference presents a detailed focus on the use of machine vision techniques in industrial inspection applications. An internationally renowned selection of experts provide insights on a range of inspection tasks, drawn from their cutting-edge work in academia and industry, covering practical issues of vision system integration for real-world applications.Topics and features: presents a comprehensive review of state-of-the-art hardware and software tools for machine vision, and the evolution of algorithms for industrial inspection; includes in-depth descriptions of advanced inspection methodologies and machine vision technologies for specific needs; discusses the latest developments and future trends in imaging and vision techniques for industrial inspection tasks; provides a focus on imaging and vision system integration, implementation, and optimization; describes the pitfalls and barriers to developing successful inspection systems for smooth and efficient manufacturing process.Bridging the gap between theoretical knowledge and engineering practice, this indispensable book will appeal to graduate students interested in imaging, machine vision, and industrial inspection. The work also serves as an excellent reference for researchers seeking to develop innovative solutions to tackle practical challenges, and for professional engineers who will benefit from the coverage of applications at both system and component level.

Dr. Zheng Liu is an Associate Professor at the University of British Columbia, Kelowna, BC, Canada. Dr. Hiroyuki Ukida is an Associate Professor in the Institute of Technology and Science at the University of Tokushima, Japan. Dr. Pradeep Ramuhalli is a Senior Research Scientist at the Pacific Northwest National Laboratory, Richland, WA, USA. Dipl.-Ing. Kurt Niel is the Head of the Department of Metrology and Control Engineering at the University of Applied Sciences Upper Austria, Wels, Austria.

Industrial Inspection with Open Eyes: Advances in Machine Vision TechnologyZheng Liu, Hiroyuki Ukida, Kurt Niel, and Pradeep RamuhalliPart I: Advances in Technology Infrared Vision: Visual Inspection Beyond the Visible SpectrumClemente Ibarra-Castanedo, Stefano Sfarra, Marc Genest, and Xavier MaldagueInspection Methods for Metal Surfaces: Image Acquisition and Algorithms for the Characterization of DefectsReinhold Huber-Mörk, Gustavo Fernández Dominguez, Svorad Stolc, Daniel Soukup, and Csaba BeleznaiFlexWarp, a Fast and Flexible Method for High-Precision Image Registration: A Non-Parametric Approach for Precise Image Registration Applied to Industrial Print InspectionHarald Penz, Franz Daubner, Ernst Bodenstorfer, and Reinhold Huber-MörkHow Optical CMMs and 3D Scanning will Revolutionize the 3D Metrology WorldJean-Francois Larue, Daniel Brown, and Marc VialaFast Three-Dimensional Shape Inspection Using a Multi-Sided MirrorIdaku IshiiEfficient Completeness Inspection Using Real-Time 3D Color Reconstruction with a Dual-Laser Triangulation SystemMatteo Munaro, Edmond Wai Yan So, Stefano Tonello, and Emanuele MenegattiX-Ray Computed Tomography for Non-Destructive Testing and Materials CharacterizationJohann Kastner and Christoph HeinzlDefect Inspection for Curved Surfaces with a Highly Specular ReflectionZhong Zhang and Changjiang LiPart II: Applications and System Integration for Vision-Based InspectionRobotic Inspection SystemsChristian Eitzinger, Sebastian Zambal, and Petra ThannerMachine Vision Techniques for Condition Assessment of Civil InfrastructureChristian Koch, Zhenhua Zhu, Stephanie Paal, and Ioannis BrilakisSmart Check 3D: An Industrial Inspection System Combining 3D Vision with Automatic Planning of Inspection View PointsNicola Carlon, Nicolò Boscolo, Stefano Tonello, and Emanuele MenegattiUltrasonic Evaluation and ImagingSusan L. Crawford, Michael T. Anderson, Aaron A. Diaz, Michael R. Larche, Matthew S. Prowant, and Anthony D. CinsonNon-Destructive Visualization Using Electromagnetic Waves for Real and Practical Sensing Technology for RoboticsYoshihisa Fujii, Hiroyoshi Togo, Soichi Oka, and Yuko FujiwaraMagneto-Optic Imaging and its ApplicationsYiming Deng, Yuhua Cheng, and Zhiwei Zeng

Erscheint lt. Verlag 24.9.2015
Reihe/Serie Advances in Computer Vision and Pattern Recognition
Advances in Computer Vision and Pattern Recognition
Zusatzinfo X, 541 p. 407 illus., 13 illus. in color.
Verlagsort London
Sprache englisch
Themenwelt Informatik Grafik / Design Digitale Bildverarbeitung
Informatik Theorie / Studium Künstliche Intelligenz / Robotik
Schlagworte Automation Sensor • Image Processing • Industrial Inspection • Machine vision • pattern recognition • System Integration and Optimization
ISBN-10 1-4471-6741-4 / 1447167414
ISBN-13 978-1-4471-6741-9 / 9781447167419
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