Integrated Imaging and Vision Techniques for Industrial Inspection
Springer London Ltd (Verlag)
978-1-4471-6740-2 (ISBN)
Dr. Zheng Liu is an Associate Professor at the University of British Columbia, Kelowna, BC, Canada. Dr. Hiroyuki Ukida is an Associate Professor in the Institute of Technology and Science at the University of Tokushima, Japan. Dr. Pradeep Ramuhalli is a Senior Research Scientist at the Pacific Northwest National Laboratory, Richland, WA, USA. Dipl.-Ing. Kurt Niel is the Head of the Department of Metrology and Control Engineering at the University of Applied Sciences Upper Austria, Wels, Austria.
Industrial Inspection with Open Eyes.- Part I: Advances in Technology.- Infrared Vision.- Inspection Methods for Metal Surfaces.- FlexWarp, a Fast and Flexible Method for High-Precision Image Registration.- How Optical CMMs and 3D Scanning will Revolutionize the 3D Metrology World.- Fast Three-Dimensional Shape Inspection Using a Multi-Sided Mirror.- Efficient Completeness Inspection Using Real-Time 3D Color Reconstruction with a Dual-Laser Triangulation System.- X-Ray Computed Tomography for Non-Destructive Testing and Materials Characterization.- Defect Inspection for Curved Surfaces with a Highly Specular Reflection.- Part II: Applications and System Integration for Vision-Based Inspection.- Robotic Inspection Systems.- Machine Vision Techniques for Condition Assessment of Civil Infrastructure.- Smart Check 3D.- Ultrasonic Evaluation and Imaging.- Non-Destructive Visualization Using Electromagnetic Waves for Real and Practical Sensing Technology for Robotics.- Magneto-Optic Imaging and its Applications.
Reihe/Serie | Advances in Pattern Recognition |
---|---|
Zusatzinfo | 13 Illustrations, color; 394 Illustrations, black and white; X, 541 p. 407 illus., 13 illus. in color. |
Verlagsort | England |
Sprache | englisch |
Maße | 155 x 235 mm |
Themenwelt | Informatik ► Grafik / Design ► Digitale Bildverarbeitung |
Informatik ► Theorie / Studium ► Künstliche Intelligenz / Robotik | |
Schlagworte | Automation Sensor • Image Processing • Industrial Inspection • Machine vision • pattern recognition • System Integration and Optimization |
ISBN-10 | 1-4471-6740-6 / 1447167406 |
ISBN-13 | 978-1-4471-6740-2 / 9781447167402 |
Zustand | Neuware |
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