Advances in X-Ray Analysis

Volume 32

Charles S. Barrett, J.V. Gilfrich, Ron Jenkins, John C. Russ, J.W. Richardson Jr. (Herausgeber)

Buch | Hardcover

682 Seiten

1989
Kluwer Academic/Plenum Publishers (Verlag)
978-0-306-43236-1 (ISBN)

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The 37th Annual Denver Conference on Applications of X-Ray Analysis was held August 1-5, 1988, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. As usual, alternating with x-ray diffraction, the emphasis this year was x-ray fluorescence, but as has been the pattern for several occasions over the last few years, the Plenary Session did not deal with that subject, specifically. In an attempt to introduce the audience to one of the new developments in x-ray analysis, the title of the session was "High Brilliance Sources/Applications," and dealt exclusively with synchrotron radiation, a topic which has made a very large impact on the x-ray community over the last decade. As the organizer and co-chairman of the Plenary Session (with Paul Predecki), it is my responsibility to report on that session here. The Conference had the privilege of obtaining the services of some of the preeminent practitioners of research using this remarkable x-ray source; they presented the audience with unusually lucid descriptions of the work which has been accomplished in the development and application of the continuous, high intensity, tunable, polarized and collimated x-rays available from no facility other than these specialized storage rings. The opening lecture (and I use that term intentionally) was an enthusiastic description of "What is Synchrotron Radiation?" by Professor Boris Batterman of Cornell University and the Cornell High Energy Synchrotron Sourc(! (CHESS).

I. High Brilliance Sources/Applications.- II. On-Line X-Ray Analysis.- III. Xrf Mathematical Models and Quantitation.- IV. Techniques And XRF Instrumentation.- V. XRF Applications.- VI. Analysis of Thin Films by XRD and XRF.- VII. X-Ray Stress Analysis.- VIII. Applications of Digitized XRD Patterns.- IX. Qualitative and Quantitative Phase Analysis Diffraction Applications.- X. X-Ray Tomography, Imaging, and Topography.- Author Index.

Zusatzinfo	XXVI, 682 p.
Verlagsort	New York
Sprache	englisch
Maße	178 x 254 mm
Themenwelt	Naturwissenschaften ► Chemie ► Analytische Chemie
	Naturwissenschaften ► Physik / Astronomie ► Allgemeines / Lexika
	Technik ► Maschinenbau
ISBN-10	0-306-43236-6 / 0306432366
ISBN-13	978-0-306-43236-1 / 9780306432361
Zustand	Neuware