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Synthetic Polymeric Membranes

Characterization by Atomic Force Microscopy

K. C. Khulbe, C. Y. Feng, Takeshi Matsuura (Autoren)

Buch | Hardcover

XVIII, 198 Seiten

2007 | 2008
Springer Berlin (Verlag)
978-3-540-73993-7 (ISBN)

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Tis book concentrates on atomic force microscopy (AFM), a method recently - veloped to study the surfaces of synthetic polymeric membranes. AFM is becoming a very important tool for the characterization of synthetic polymeric membranes. Te development of membranes of improved performance depends on the exact kn- ledge of the morphology of a thin selective layer that exists at the surface of the m- brane. Te control of the morphology of the selective layer is crucial for the design of synthetic polymeric membranes. With a relatively short history of only twen- ?ve years, AFM has ?rmly established its position as a method to characterize the membrane surface. Each chapter of this book includes information on basic principles, commercial applications, current research, and guidelines for future research. Each chapter is summarized at the end and contains a comprehensive list of references. Te introductory chapter gives a brief overview of synthetic polymeric m- branes and their applications both in industrial processes and in biomedical ?elds. It also gives an overview of studies on membrane surface morphology by various methods. Chapter ? deals with the synthesis of membranes, the properties of membranes, and the application of membranes. Te beginning also identi?es the three types of membranes (i.e., biological, synthetic, and theoretical) and their applications.

Synthetic Membranes for Membrane Processes.- Atomic Force Microscopy.- Nodular Structure of Polymers in the Membrane.- Pore Size, Pore Size Distribution, and Roughness at the Membrane Surface.- Cross-sectional AFM Image.- Adhesion.- Membrane Surface Morphology and Membrane Performance.

From the reviews:

"This latest addition to the Springer Laboratory series provides a good overview of membrane technology and the application of atomic force microscopy (AFM) in membrane characterization. It is easy to read ... . In summary, this book presents a good introduction to the field of membrane science and technology. It will be of interest to both academics and industrialists involved in the use of membranes in separation processes and will be particularly welcomed by experimentalists who wish to become involved in AFM." (Peter A. Williams, Materials Today, Vol. 11 (5), May, 2008)

Erscheint lt. Verlag	17.12.2007
Reihe/Serie	Springer Laboratory
Zusatzinfo	XVIII, 198 p. 146 illus.
Verlagsort	Berlin
Sprache	englisch
Maße	155 x 235 mm
Gewicht	500 g
Themenwelt	Naturwissenschaften ► Chemie ► Organische Chemie
Themenwelt	Technik ► Maschinenbau
Schlagworte	AFM • Atomic force microscopy • Helium-Atom-Streuung • Membranes • Membran (Technik) • Morphology • PED • Polymer • Polymerchemie • Polymers • Surfaces
ISBN-10	3-540-73993-9 / 3540739939
ISBN-13	978-3-540-73993-7 / 9783540739937
Zustand	Neuware