Transmission Electron Microscopy and Diffractometry of Materials
Springer Berlin (Verlag)
978-3-540-73885-5 (ISBN)
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This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM. This edition is not substantially longer than the second, but all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. The book explains the fundamentals of how waves and wave functions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
Professor James M. Howe is Director of the Nanoscale Materials Characterization Facility in the Department of Materials Science and Engineering at the University of Virginia (USA). He has received several awards for his research, including a Senior Research Award from the von Humboldt Foundation (Germany), the Materials Science Research Silver Medal from ASM International, and the TMS Champion H. Mathewson Medal from TMS. He has published over 200 technical papers, two book chapters and two symposium proceedings. He is author of the textbook "Interfaces in Materials" and co-author of the textbook "Transmission Electron Microscopy and Diffractometry of Materials".
Diffraction and the X-Ray Powder Diffractometer.- The TEM and Its Optics.- Scattering.- Inelastic Electron Scattering and Spectroscopy.- Diffraction from Crystals.- Electron Diffraction and Crystallography.- Diffraction Contrast in TEM Images.- Diffraction Lineshapes.- Patterson Functions and Diffuse Scattering.- High-Resolution TEM Imaging.- High-Resolution STEM Imaging.- Dynamical Theory.
| Sprache | englisch |
|---|---|
| Maße | 155 x 235 mm |
| Gewicht | 1196 g |
| Einbandart | gebunden |
| Themenwelt | Technik ► Maschinenbau |
| Schlagworte | Beugung • Beugung / Diffraktion • diffraction • electron microscopy • Elektronenmikroskopie • Hardcover, Softcover / Technik/Maschinenbau, Fertigungstechnik • HC/Technik/Maschinenbau, Fertigungstechnik • Imaging • materials characterization • spectroscopy |
| ISBN-10 | 3-540-73885-1 / 3540738851 |
| ISBN-13 | 978-3-540-73885-5 / 9783540738855 |
| Zustand | Neuware |
| Informationen gemäß Produktsicherheitsverordnung (GPSR) | |
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