Nanoscaled Semiconductor-on-Insulator Structures and Devices
Springer-Verlag New York Inc.
978-1-4020-6379-4 (ISBN)
Nanoscaled SOI Material and Device Technologies.- Status and trends in SOI nanodevices.- Non-Planar Devices for Nanoscale CMOS.- High-? Dielectric Stacks for Nanoscaled SOI Devices.- Nanoscaled Semiconductor Heterostructures for CMOS Transistors Formed by Ion Implantation and Hydrogen Transfer.- Fluorine –Vacancy Engineering: A Viable Solution for Dopant Diffusion Suppression in SOI Substrates.- Suspended Silicon-On-Insulator Nanowires for the Fabrication of Quadruple Gate MOSFETs.- Physics of Novel Nanoscaled SemOI Devices.- Integration of silicon Single-Electron Transistors Operating at Room Temperature.- SiGe Nanodots in Electro-Optical SOI Devices.- Nanowire Quantum Effects in Trigate SOI MOSFETs.- Semiconductor Nanostructures and Devices.- MuGFET CMOS Process with Midgap Gate Material.- Doping Fluctuation Effects in Multiple-Gate SOI MOSFETs.- SiGeC HBTs: impact of C on Device Performance.- Reliability and Characterization of Nanoscaled SOI Devices.- Noise Research of Nanoscaled SOI Devices.- Electrical Characterization and Special Properties of FINFET Structures.- Substrate Effect on the Output Conductance Frequency Response of SOI MOSFETs.- Investigation of Compressive Strain Effects Induced by STI and ESL.- Charge Trapping Phenomena in Single Electron NVM SOI Devices Fabricated by a Self-Aligned Quantum DOT Technology.- Theory and Modeling of Nanoscaled Devices.- Variability in Nanoscale UTB SOI Devices and its Impact on Circuits and Systems.- Electron Transport in Silicon-on-Insulator Nanodevices.- All Quantum Simulation of Ultrathin SOI MOSFETs.- Resonant Tunneling Devices on SOI Basis.- Mobility Modeling in SOI FETs for Different Substrate Orientations and Strain Conditions.- Three-Dimensional (3-D) Analytical Modeling of the Threshold Voltage, DIBL andSubthreshold Swing of Cylindrical Gate all Around Mosfets.
Erscheint lt. Verlag | 6.7.2007 |
---|---|
Reihe/Serie | NATO Science for Peace and Security Series |
Zusatzinfo | XIII, 369 p. |
Verlagsort | New York, NY |
Sprache | englisch |
Maße | 155 x 235 mm |
Themenwelt | Technik ► Elektrotechnik / Energietechnik |
Technik ► Maschinenbau | |
ISBN-10 | 1-4020-6379-2 / 1402063792 |
ISBN-13 | 978-1-4020-6379-4 / 9781402063794 |
Zustand | Neuware |
Haben Sie eine Frage zum Produkt? |
aus dem Bereich