Materials Science in Microelectronics II

The Effects of Structure on Properties in Thin Films

Eugene Machlin (Autor)

Buch | Hardcover

228 Seiten

2005 | 2nd edition
Elsevier Science Ltd (Verlag)
978-0-08-044639-4 (ISBN)

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Looks at the importance of thin films to microelectronic development. This title examines the effect of structure on: electrical properties; magnetic properties; optical properties; mechanical properties; mass transport properties; interface and junction properties; defects and properties.

The subject matter of thin-films – which play a key role in microelectronics – divides naturally into two headings: the processing / structure relationship, and the structure / properties relationship. Part II of 'Materials Science in Microelectronics' focuses on the latter of these relationships, examining the effect of structure on the following: •Electrical properties•Magnetic properties•Optical properties•Mechanical properties•Mass transport properties•Interface and junction properties•Defects and properties

Erscheint lt. Verlag	29.11.2005
Verlagsort	Oxford
Sprache	englisch
Maße	152 x 229 mm
Gewicht	510 g
Themenwelt	Technik ► Elektrotechnik / Energietechnik
ISBN-10	0-08-044639-6 / 0080446396
ISBN-13	978-0-08-044639-4 / 9780080446394
Zustand	Neuware