Certifying Central Facility Beamlines for Biological and Chemical Crystallography and Allied Methods
Springer International Publishing (Verlag)
978-3-031-80183-9 (ISBN)
- Noch nicht erschienen - erscheint am 29.01.2026
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This book briefs beamline providers and users on what to look for when selecting experiments for a given type of facility and beamline so that beamtime usage and effectiveness can be maximized. It navigates facility publications, as well as data management and sharing policies. Like this, the information presented helps avoid potential pitfalls between facility and user on these important post-experiment aspects. Allied analytical methods are also described in terms of their certification for confident provision and use.
John R Helliwell, DSc (Physics, University of York), DPhil (Molecular Biophysics, Oxford University) is Emeritus Professor of Chemistry at The University of Manchester. At the Synchrotron Radiation Source at the UK's Daresbury Laboratory he held various appointments between 1979 to 2008, including as Director of Synchrotron Radiation Science. He is a Fellow of the Institute of Physics, the Royal Society of Chemistry, the Royal Society of Biology, the American Crystallographic Association, an Honorary Member of the British Crystallographic Association and of the British Biophysical Society, a Corresponding member of the Royal Academy of Sciences & Arts of Barcelona, Spain and an Honorary Member of the National Institute of Chemistry, Slovenia. His awards include the European Crystallographic Association Eighth Max Perutz Prize 2015, the American Crystallographic Association Patterson Award 2014, and the 'Professor K Banerjee Endowment Lecture Silver Medal' of the Indian Association for the Cultivation of Science 2001. He has served as President of the European Crystallographic Association (2007 to 2010), Chairman of the International Union of Crystallography's (IUCr) Commission on Journals (1996-2005), Chairman of the IUCr Diffraction Data Deposition Working Group (2011 to 2017) and its Committee on Data (2017 onwards) and its Representative to CODATA (2012 onwards).
1.A beginner's guide to synchrotron radiation and X-ray lasers.- 2.A beginner's guide to neutron reactor and spallation sources and detectors.- 3.A beginner's guide to detectors in use at X-ray beamlines and their calibration.- 4.Introduction to X-ray beamlines for crystallography.- 5.Guidance in preparing the experiment at your home facility including sample preparation.- 6.Beamline scientist perspective.- 7.Beamline user perspective.- 8.Fixed wavelength high intensity beamline.- 9.Tuneable wavelength beamline.- 10.Laue diffraction beamline.- 11.Microfocus beamline.- 12.Serial crystallography beamline: synchrotron.- 13.Serial crystallography beamline: X-ray laser.- 14.Time-resolved crystallography.- 15.Electron crystallography facility.- 16.Neutron crystallography instruments.- 17.Facility data archiving policy considerations.- 18.Facility publication authorship policies.- 19.Sample environment, cryostats and or containment, light sources for photo-initiation or mixing devices for reactions in a crystal.- 20.Electron biological imaging centres at the SR facilities: Diamond, ESRF, Soleil and SSRL/SLAC as examples.- 21.NMR crystallography.- 22.Small and Wide-Angle Scattering beamlines.- 23.X-ray absorption spectroscopy beamlines.- 24.Mass spectroscopy.- 25.UV/Vis and Infra-red spectroscopy.- 26.Data analysis and software.- 27.Safety Matters.- 28.Theoretical and Computational Sciences.- 29.Summary.- 30.So, to the Measuring Team briefing before the Experiment.
| Erscheint lt. Verlag | 29.1.2026 |
|---|---|
| Reihe/Serie | SpringerBriefs in Crystallography |
| Zusatzinfo | Approx. 70 p. |
| Verlagsort | Cham |
| Sprache | englisch |
| Maße | 155 x 235 mm |
| Themenwelt | Naturwissenschaften ► Chemie ► Analytische Chemie |
| Naturwissenschaften ► Geowissenschaften ► Geologie | |
| Technik ► Maschinenbau | |
| Schlagworte | Diffraction Data Collection • Neutron crystallography instruments • neutron reactor • Synchrotron radiation • Wavelength beamline • x-ray lasers |
| ISBN-10 | 3-031-80183-0 / 3031801830 |
| ISBN-13 | 978-3-031-80183-9 / 9783031801839 |
| Zustand | Neuware |
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