Electron Nano-imaging

Basics of Imaging and Diffraction for TEM and STEM

Nobuo Tanaka (Autor)

Buch | Hardcover

384 Seiten

2024 | Second Edition 2024
Springer Verlag, Japan
978-4-431-56939-8 (ISBN)

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In this second edition, most chapters of the first edition, which published in 2017, have been revised and recent advancement of electron microscopy such as differential phase contrast (DPC) STEM, sparse-coding image processing and quantum electron microscopy have been supplemented with further details. This book explains the basis of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) in the style of a textbook. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices. The comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique in comparison with other advanced resources on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by various kinds of knowledge around electron microscopy. The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide for today’s graduate students and professionals just starting their careers.

Dr. Nobuo Tanaka is a designated professor of Institute of Materials and Systems for Sustainability (IMaSS) of Nagoya University and an adjunct senior researcher of Japan Fine Ceramic Center (JFCC) and Nagoya Industrial Science Research Institute (NISRI). He received a Ph.D. degree from Applied Physics Department of Nagoya University in 1978 and became an assistant professor of the department. He stayed Arizona State University as a visiting scholar to study with the late Prof. J. Cowley from 1983 to 1985. He was appointed a full professor of Applied Physics of Nagoya University in 1999 through an associate professor. In 2001, he moved to Center of Integrated Research for Science and Engineering (CIRSE) of Nagoya University, which was renamed EcoTopia Science Institute (ESI) in 2004 and IMaSS in 2015. He was the director of the institute from 2012 to 2015. He was also the president of Japanese Microscopy Society (JSM) from 2015 to 2017.

Chapter 1 Seeing nanometer-sized world.- Chgapter 2 Structure and imaging of a transmission electron microscope (TEM).- Chapter 3 Basic theories of TEM imaging.- Chapter 4 Resolution and image contrast of a transmission electron microscope (TEM).- Chapter 5 What is high-resolution transmission electron microscopy ?.

Erscheinungsdatum	03.08.2024
Zusatzinfo	13 Illustrations, color; 129 Illustrations, black and white; XXX, 384 p. 142 illus., 13 illus. in color.
Verlagsort	Tokyo
Sprache	englisch
Maße	155 x 235 mm
Themenwelt	Naturwissenschaften ► Chemie ► Analytische Chemie
Themenwelt	Technik ► Maschinenbau
Schlagworte	Aberration Corrector • Annular Bright Field (ABF) STEM • Annular Dark Field (ADF) STEM • Continuous or Pulsed Electron Sources • Contrast Transfer Function (CTF) • Differential Phase Contrast (DPC) STEM • Electron-energy Loss Spectroscopy (EELS) • Electron Nano-diffraction • Energy-filtered TEM (EFTEM) • High-resolution Electron Microscopy • Image Contrast of TEM and STEM • Image Simulation • Lattice-fringe Imaging in TEM • monochromator • Nanometer-sized Objects • Scanning Transmission Electron Microscopy (STEM) • Sparse-coding Image Processing • Structure Image in TEM • Transmission Electron Microscopy (TEM)
ISBN-10	4-431-56939-1 / 4431569391
ISBN-13	978-4-431-56939-8 / 9784431569398
Zustand	Neuware