Practical Guide to Materials Characterization
Wiley-VCH (Verlag)
978-3-527-35071-1 (ISBN)
Khalid Sultan is Assistant Professor in the Department of Physics of the Central University of Kashmir. His research interests are the rare earth transition metal oxide systems, characterized by electric, transport, dielectric, magnetic and X-ray measurements as well as by a variety of microscopy and spectroscopy techniques. Dr. Sultan has international collaborations with the Pohang Accelerator Lab and the Advanced Analysis Center of the Korea Institute of Technology.
BASICS OF MATERIAL CHARACTERIZATION TECHNIQUES
Introduction
Electromagnetic Spectrum
Fundamentals of Crystallography
Molecular Vibrations
Magnetism in Solids
Optical Properties of Solids
X-RAY DIFFRACTION
Introduction
Bragg's Law
Von Laue Treatment: Laue's Equation
Experimental Techniques
Geometry and Instrumentation
Stadard X-Ray Diffraction Pattern
Applications
Examples and Illustrations
RAMAN SPECTROSCOPY
Introduction
Infrared and Raman Spectroscopy
Raman Spectra: Origin
Classical Theory of Raman Scattering
Quantum Theory of Raman Spectroscopy
Raman Spectrometer
Resonance Raman Spectroscopy
Special Techniques
Applications and Illustrations
X-RAY SPECTROSCOPIC TECHNIQUES
X-Ray Absorption Spectroscopy (XAS)
X-Ray Photoelectron Spectroscopy (XPS)
Auger Electron Spectroscopy (AES)
MAGNETIC MEASUREMENTS
Introduction
Magnetization Measuring Instruments
Advantages and Disadvantage of Vibrating Sample Magnetometer (VSM)
Susceptibility Measurement
Examples and Illustrations
DIELECTRIC MEASUREMENTS
Introduction
Polarization and Dielectric Constant
Mechanism for Colossal Dielectric Response
Frequency Dependence of Polarizability
Classification of Dielectric Materials
Dielectric Dispersion: A Brief Discussion
Dielectric Loss and Relaxation
Complex Permittivity
Polarization Build Up
Jonscher's Universal Law
Examples and Illustrations
ELECTRON MICROSCOPY
Introduction
Generation of Electron Beam
Interaction of Electron Beam with Sample
Inelastic Scattering and Absorption
The Family of Electron Microscopes
Atomic Force Microscopy
Examples and Illustrations
INFRARED SPECTROSCOPY
Introduction
Instrumentation for FTIR
Fourier Transform
Electromagnetic Radiation
Infrared Absorption
Normal Modes of Vibration
Complicating Factors
Applications of IR Spectroscopy
| Erscheinungsdatum | 28.09.2022 |
|---|---|
| Verlagsort | Weinheim |
| Sprache | englisch |
| Maße | 170 x 244 mm |
| Gewicht | 666 g |
| Themenwelt | Naturwissenschaften ► Chemie |
| Technik ► Maschinenbau | |
| Schlagworte | Chemie • Chemistry • Festkörperphysik • materials characterization • Materials Science • Materialwissenschaften • Physics • Physik • Solid state physics • spectroscopy • Spektroskopie • Werkstoffprüfung |
| ISBN-10 | 3-527-35071-3 / 3527350713 |
| ISBN-13 | 978-3-527-35071-1 / 9783527350711 |
| Zustand | Neuware |
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