Microscopy of Semiconducting Materials 1991, Proceedings of the Institute of Physics Conference held at Oxford University, 25-28 March 1991

Buch | Hardcover

824 Seiten

1991
Institute of Physics Publishing (Verlag)
978-0-85498-406-0 (ISBN)

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This volume contains the invited and contributed papers presented at a conference which focused on recent developments in the microscopical studies of semiconductors. The techniques discussed represent in many cases the only methods available to determine materials characteristics.

The seventh conference on the Microscopy of Semiconducting Materials was held at Oxford University on 25-28 March 1991. As in previous years the conference had a totally international flavour with many of the world's leading researchers present. Scientific sponsorship was provided by the Electron Microscopy and Analysis Group of the Institute of Physics, the Royal Microscopical Society and the Materials Research Society. This volume contains both the invited and contributed papers from the

High resolution microscopy (9 papers). Microanalysis (10 papers). Dislocations and grain boundaries (10 papers). Processed silicon (18 papers). Metal semiconductor contacts and silicides (17 papers). Bulk gallium arsenide and other compounds (12 papers). Epitaxial layers (31 papers). Quantum wells and superlattices (21 papers). X-ray studies (8 papers). Advanced scanning microscopy techniques (24 papers). Indexes.

Erscheint lt. Verlag	1.1.1991
Verlagsort	London
Sprache	englisch
Themenwelt	Naturwissenschaften ► Physik / Astronomie ► Elektrodynamik
Themenwelt	Technik ► Maschinenbau
ISBN-10	0-85498-406-2 / 0854984062
ISBN-13	978-0-85498-406-0 / 9780854984060
Zustand	Neuware