Microelectronic Systems
Design, Modelling and Testing
Seiten
1997
Butterworth-Heinemann Ltd (Verlag)
978-0-340-67771-1 (ISBN)
Butterworth-Heinemann Ltd (Verlag)
978-0-340-67771-1 (ISBN)
- Keine Verlagsinformationen verfügbar
- Artikel merken
This text provides a comprehensive coverage, from conception, through modelling to testing, of microelectronic systems. Bi-Polar and MOS design are covered, as are memory systems and field programmable gate arrays.
This text provides a comprehensive overview of the design, modelling and testing of microelectronic systems. After a brief introduction to the history and development of microelectronics, Bi-Polar and MOS Design (including CMOS and NMOS) are discussed. After coverage of memory systems and field programmable gate arrays it then goes on to explore all aspects of modelling, including VHDL, PSPICE and fault modelling. The third part looks at practical testing of systems, including a discussion of designing for testability and memory tests. The book finishes with a number of appendices providing vital reference material for MOS characteristics, IC fabrication, design rules, VHDL and PSPICE references, including a PSPICE tutorial.
This text provides a comprehensive overview of the design, modelling and testing of microelectronic systems. After a brief introduction to the history and development of microelectronics, Bi-Polar and MOS Design (including CMOS and NMOS) are discussed. After coverage of memory systems and field programmable gate arrays it then goes on to explore all aspects of modelling, including VHDL, PSPICE and fault modelling. The third part looks at practical testing of systems, including a discussion of designing for testability and memory tests. The book finishes with a number of appendices providing vital reference material for MOS characteristics, IC fabrication, design rules, VHDL and PSPICE references, including a PSPICE tutorial.
Bi-Polar design; MOS design; memory systems; field programmable gate arrays; high-level modelling; VHDL modelling; memory tests; MOS characteristics; IC fabrication; CMOS/NMOS design rules; traffic light controller simulator; VHDL reference; PSPICE - tutorial, reference, modelling; fault modelling; designing for test.
Erscheint lt. Verlag | 31.1.1997 |
---|---|
Zusatzinfo | illustrations |
Verlagsort | Oxford |
Sprache | englisch |
Maße | 234 x 157 mm |
Gewicht | 450 g |
Themenwelt | Technik ► Elektrotechnik / Energietechnik |
ISBN-10 | 0-340-67771-6 / 0340677716 |
ISBN-13 | 978-0-340-67771-1 / 9780340677711 |
Zustand | Neuware |
Haben Sie eine Frage zum Produkt? |
Mehr entdecken
aus dem Bereich
aus dem Bereich
Wegweiser für Elektrofachkräfte
Buch | Hardcover (2024)
VDE VERLAG
CHF 67,20