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Reliability and Risk Analysis in Engineering and Medicine - Chandrasekhar Putcha, Subhrajit Dutta, Sanjay K. Gupta

Reliability and Risk Analysis in Engineering and Medicine

Buch | Hardcover
XII, 129 Seiten
2021 | 1st ed. 2021
Springer International Publishing (Verlag)
978-3-030-80453-4 (ISBN)
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This graduate textbook imparts the fundamentals of reliability and risk that can be connected mathematically and applied to problems in engineering and medical science and practice. The book is divided into eight chapters, the first three of which deal with basic fundamentals of probability theory and reliability methods. The fourth chapter illustrates simulation methods needed to solve complex problems. Chapters 5-7 explain reliability codes and system reliability (which uses the component reliabilities discussed in previous chapters). The book concludes in chapter 8 with an examination of applications of reliability within engineering and medical fields. Presenting a highly relevant competency for graduates entering product research and development, or facilities operations sectors, this text includes many examples and end of chapter study questions to maximize student comprehension.
  • Explains concepts of reliability and risk estimation techniques in the contextof medicine and engineering;
  • Elucidates the interplay between reliability and risk from design to operation phases;
  • Uses real world examples from engineering structures and medical devices and protocols;
  • Adopts a lucid yet rigorous presentation of reliability and risk calculations;
  • Reinforces students understanding of concepts covered with end-of-chapter exercises.

lt;p>Dr. Chandrasekhar Putcha is a Professor in the Department of Civil and Environmental Engineering at California State University, Fullerton. He has been at this place since 1981. Before that he was on the research faculty at West Virginia University, Morgantown, WV and a post-doctoral fellow at the University of Sherbrooke in Canada. His research areas of interest are Reliability, Risk Analysis, Optimization and Mathematical Modeling. 

Dr. Subhrajit Dutta is an Assistant Professor in the Department of Civil Engineering at National Institute of Technology Silchar. He completed his PhD in Civil Engineering from Indian Institute of Technology Bombay in 2017. Subhrajit is also an external/invited researcher in the Department of Civil Engineering (Structural Division), Faculty of Engineering, University of Porto, Portugal. He was working as a visiting scholar in the Department of Civil Engineering at Aalto University, Finland during December, 2019. He has published more than 50 research articles and is a recipient of few national and international sponsored projects in the field of reliability and risk analysis. Subhrajit is the Associate Editor of ASCE Practice Periodical on Structural Design and Construction and a Guest Editor for various reputed journals.

Dr. Sanjay Gupta is an Associate Professor of Civil Engineering at IIT/BHU, Varanasi, India.

Introduction.- Probability Theory.- Basic  Reliability Methods.- Probabilistic Simulation Methods.- Reliability-Based Design Codes.- System Reliability.- Concepts of Risk Analysis.- Application of Reliability and Risk  Principles to Medical Field.

Erscheinungsdatum
Reihe/Serie Transactions on Computational Science and Computational Intelligence
Zusatzinfo XII, 129 p. 67 illus., 24 illus. in color.
Verlagsort Cham
Sprache englisch
Maße 155 x 235 mm
Gewicht 372 g
Themenwelt Technik Maschinenbau
Schlagworte Bayes Theorem • Creatinine • Cumulative Risk Factor • Decision Theory • Density Function • Entropy • Fast Blood Sugar • Linear and Non linear Truss • Monte Carlo simulation • Normal distribution • Post Traumatic Stress Disorder (PTSD) • Post Traumatic Stress Index (PTSI) • Probability Theory • Regression • Reliability in Engineering • Reliability in Medicine • risk analysis • Stroke Index • Tensile Membrane • Total Cholesterol level • Uniform distribution
ISBN-10 3-030-80453-4 / 3030804534
ISBN-13 978-3-030-80453-4 / 9783030804534
Zustand Neuware
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