Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory
Springer Verlag, Singapore
978-981-15-2219-2 (ISBN)
Ms. Rui Lan received the B.S. degree from Department of Material Science and Technology, Dalian University of Technology, Dalian, China in 2005, the M.S. and Ph.D. degrees from Department of Metallurgy and Ceramics Sciences, Tokyo Institute of Technology (TITECH), Japan in 2009 and 2012, respectively. Since 2013, she has been an Associate Professor at Department of Material Science and Technology, Jiangsu University of Science and Technology, Zhenjiang, China. Her research interests include Phase change storage materials, thermoelectric thin film materials, high-entropy alloy coating and semiconductor materials.
Introduction .- Establishment of the hot strip method for thermal conductivity meausurements of Ge-Sb-Te alloys.- Thermal conductivities of Ge-Sb-Te alloys.- Electrical resistivities of Ge-Sb-Te alloys.- Thermal conduction mechanisms and prediction equations of thermal conductivity for Ge-Sb-Te alloys.- Densities of Ge-Sb-Te alloys.- Summary and conclusions.
| Erscheinungsdatum | 15.01.2021 |
|---|---|
| Zusatzinfo | 64 Illustrations, color; 56 Illustrations, black and white; XI, 139 p. 120 illus., 64 illus. in color. |
| Verlagsort | Singapore |
| Sprache | englisch |
| Maße | 155 x 235 mm |
| Themenwelt | Technik ► Elektrotechnik / Energietechnik |
| Technik ► Maschinenbau | |
| Schlagworte | Density Measurement • electrical conductivity • Ge-Sb-Te alloys • Measuring technique • phase change materials • Phase change memory • thermal conductivity • Thermophysical properties |
| ISBN-10 | 981-15-2219-7 / 9811522197 |
| ISBN-13 | 978-981-15-2219-2 / 9789811522192 |
| Zustand | Neuware |
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