Manipulating Anisotropic Transport and Superconductivity by Focused Ion Beam Microstructuring
Seiten
2020
|
1st ed. 2020
Springer International Publishing (Verlag)
978-3-030-51361-0 (ISBN)
Springer International Publishing (Verlag)
978-3-030-51361-0 (ISBN)
This thesis presents pioneering work in the relatively new field of focused ion beam (FIB) sculpting of single crystals to produce bespoke devices and enable the investigation of physics that cannot be studied in bulk samples. It begins with a comprehensive and didactic account of how to achieve this sculpting, revealing the 'tricks of the trade' of state-of-the-art FIB microstructuring. In subsequent chapters, the author presents ground-breaking results obtained from microstructures of the delafossite oxide metal PdCoO 2 and the heavy fermion superconductor CeIrIn 5 . In these elegant, forefront experiments, a new form of directional ballistic transport in the ultra-pure delafossites is described and explained. Furthermore, a new way to spatially modulate superconductivity induced by strain is demonstrated with electrical transport measurements that agree well with predictions based on thermoelastic finite element simulations.
I ntroduction.- Focused Ion Beam Micro-Machining.- On the Ballistic Motion of Electrons in PdCoO2.- Spatially Modulated Heavy Fermion Superconductivity in CeIrIn5.- Summary and Outlook.- Appendix.
| Erscheinungsdatum | 30.08.2020 |
|---|---|
| Reihe/Serie | Springer Theses |
| Zusatzinfo | XVII, 153 p. 97 illus., 83 illus. in color. |
| Verlagsort | Cham |
| Sprache | englisch |
| Maße | 155 x 235 mm |
| Gewicht | 430 g |
| Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Festkörperphysik |
| Technik ► Elektrotechnik / Energietechnik | |
| Technik ► Maschinenbau | |
| Schlagworte | CeIrIn5 • Delafossites • Directional Balllistic Electron Transport • Focused Ion Beam (FIB) Microstructuring • heavy fermion superconductivity • PdCoO2 • Spatial Strain Modulation • Thermoelastic Finite Element Simulations • Transport Device Fabrication • Transverse Electron Focusing (TEF) |
| ISBN-10 | 3-030-51361-0 / 3030513610 |
| ISBN-13 | 978-3-030-51361-0 / 9783030513610 |
| Zustand | Neuware |
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