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Inelastic Scattering

Of X-Rays with Very High Energy Resolution

Eberhard Burkel (Autor)

XV, 112 Seiten
1991
Springer Berlin (Hersteller)
978-3-540-54418-0 (ISBN)
CHF 89,95 inkl. MwSt
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This work offers information on the new technologies that have made it possible to achieve inelastic scattering of X-rays, which allow direct observation of the small energy shifts of photons.
This work offers information on the new technologies that have made it possible to achieve inelastic scattering of X-rays, which allow direct observation of the small energy shifts of photons. Studies of lattice vibrations, of excitations in molecular crystals, of collective excitations in liquids and electronic excitations in crystals demonstrating the broad applicability and power of this new technology, are all discussed. The energies of very small excitations of condensed matter (crystals, liquids), important not only in physics, but particularly in biology, chemistry and materials sciences can also be measured by inelastic X-ray scattering. The technology is expected to become a standard diagnostic method in these disciplines.
Zusatzinfo 70 figs.
Verlagsort Berlin
Sprache englisch
Gewicht 320 g
Einbandart gebunden
Themenwelt Naturwissenschaften Physik / Astronomie Hochenergiephysik / Teilchenphysik
Naturwissenschaften Physik / Astronomie Strömungsmechanik
Technik Maschinenbau
ISBN-10 3-540-54418-6 / 3540544186
ISBN-13 978-3-540-54418-0 / 9783540544180
Zustand Neuware
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