An Introduction to Surface Analysis by XPS and AES
Seiten
2003
|
2nd Revised edition
John Wiley & Sons Ltd (Verlag)
978-0-470-84712-1 (ISBN)
John Wiley & Sons Ltd (Verlag)
978-0-470-84712-1 (ISBN)
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Provides introduction to spectroscopic techniques in surface analysis. This book includes descriptions of instruments and techniques. It covers material on angle resolved XPS, surface engineering and complimentary methods.
Extensively revised and updated with additional material included in existing chapters and new material on angle resolved XPS, surface engineering and complimentary methods. Includes an accessible introduction to the key spectroscopic techniques in surface analysis. Provides descriptions of latest instruments and techniques. Includes a detailed glossary of key surface analysis terms.
Extensively revised and updated with additional material included in existing chapters and new material on angle resolved XPS, surface engineering and complimentary methods. Includes an accessible introduction to the key spectroscopic techniques in surface analysis. Provides descriptions of latest instruments and techniques. Includes a detailed glossary of key surface analysis terms.
Preface. Acknowledgements. Electron Spectroscopy: Some Basic Concepts. Electron Spectrometer Design. The Electron Spectrum: Qualitative and Quantitative Interpretation. Compositional Depth Profiling. Applications of Electron Spectroscopy in Materials Science. Comparison of XPS and AES with Other Analytical Techniques. Glossary. Bibliography. Appendix 1. Auger Electron Energies. Appendix 2. Table of Binding Energies Accessible with AIKalpha Radiation. Index.
Erscheint lt. Verlag | 21.3.2003 |
---|---|
Zusatzinfo | Illustrations |
Verlagsort | Chichester |
Sprache | englisch |
Maße | 158 x 236 mm |
Gewicht | 514 g |
Einbandart | gebunden |
Themenwelt | Naturwissenschaften ► Chemie ► Analytische Chemie |
Technik ► Maschinenbau | |
ISBN-10 | 0-470-84712-3 / 0470847123 |
ISBN-13 | 978-0-470-84712-1 / 9780470847121 |
Zustand | Neuware |
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