An Introduction to Surface Analysis by XPS and AES 2e
Seiten
2019
Wiley-Blackwell (Hersteller)
978-1-119-41765-1 (ISBN)
Wiley-Blackwell (Hersteller)
978-1-119-41765-1 (ISBN)
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Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis
This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum.
Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples--including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques.
Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantification
Explores key spectroscopic techniques in surface analysis
Provides descriptions of latest instruments and techniques
Includes a detailed glossary of key surface analysis terms
Features an extensive bibliography of key references and additional reading
Uses a non-theoretical style to appeal to industrial surface analysis sectors
An Introduction to Surface Analysis by XPS and AES, 2nd Edition is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES.
This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum.
Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples--including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques.
Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantification
Explores key spectroscopic techniques in surface analysis
Provides descriptions of latest instruments and techniques
Includes a detailed glossary of key surface analysis terms
Features an extensive bibliography of key references and additional reading
Uses a non-theoretical style to appeal to industrial surface analysis sectors
An Introduction to Surface Analysis by XPS and AES, 2nd Edition is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES.
John F. Watts FREng is Professor of Materials Science in the Department of Mechanical Engineering Sciences at the University of Surrey. He currently leads a Research Group applying surface analysis methods to investigations in materials science and is Editor-in-Chief of the Wiley journal Surface and Interface Analysis. John Wolstenholme is now retired, having worked for Thermo Fisher Scientific (formally VG Scientific) for over 28 years in roles such as sales, marketing and applications. He remains as an active participant on the ISO Technical Committee 201, developing and revising International Standards relevant to electron spectroscopy.
| Verlagsort | Hoboken |
|---|---|
| Sprache | englisch |
| Maße | 150 x 250 mm |
| Gewicht | 666 g |
| Themenwelt | Naturwissenschaften ► Chemie |
| Technik ► Maschinenbau | |
| ISBN-10 | 1-119-41765-1 / 1119417651 |
| ISBN-13 | 978-1-119-41765-1 / 9781119417651 |
| Zustand | Neuware |
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