Ion Beams for Materials Analysis

R. Curtis Bird, J. S. Williams (Herausgeber)

Buch | Hardcover

719 Seiten

1990
Academic Press Inc (Verlag)
978-0-12-099740-4 (ISBN)

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The use of ion beams for materials analysis involves many different ion-atom interaction processes which previously have largely been considered in separate reviews and texts. A list of books and conference proceedings is given in Table 2. This book is divided into three parts, the first which treats all ion beam techniques and their applications in such diverse fields as materials science, thin film and semiconductor technology, surface science, geology, biology, medicine, environmental science, archaeology and so on.

Concepts and Principles of Ion Beam Analysis. Techniques and Equipment. High Energy Ion Scattering Spectrometry. Nuclear Reactions. Ion Induced X-ray Emission. Channelling. Depth Profiling of Surface Layers during Ion Bombardment. Low Energy Ion Scattering from Surfaces. Ion Scattering from Surfaces and Interfaces. Microprobe Analysis. Critical Assessment of Analysis Capabilities. General Methods. Directory of Materials. Data Lists.

Erscheint lt. Verlag	5.2.1990
Verlagsort	San Diego
Sprache	englisch
Maße	152 x 229 mm
Gewicht	1188 g
Themenwelt	Naturwissenschaften ► Chemie ► Physikalische Chemie
Themenwelt	Technik ► Maschinenbau
ISBN-10	0-12-099740-1 / 0120997401
ISBN-13	978-0-12-099740-4 / 9780120997404
Zustand	Neuware