The Rietveld Method
Oxford University Press (Verlag)
978-0-19-855577-3 (ISBN)
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The Rietveld method is a powerful and relatively new method for extracting detailed crystal structural information from X-ray and neutron powder diffraction data. Since such structural details dictate much of the physical and chemical attributes of materials, knowledge of them is crucial to our understanding of those properties and our ability to manipulate them. Since most materials of technological interest are not available as single crystals but often only available in polycrystalline or powder form, the Rietveld method has become very important and is now widely used in all branches of science that deal with materials at the atomic level. This book, a collaboration by many authorities in the field, is intended primarily to have tutorial and advisory value for those who already have some experience with this important method, but an introductory chapter aims to ensure that the book may be used as a first text for researchers starting in this area of science.
The book should therefore be useful to scientists who use the Rietveld method, graduate students starting research in this area, powder diffraction scientists, crystallographers, physicists, chemists and material scientists.
Introduction to the Rietveld Method, R.A. Young; the early days - a retrospective view, H.M. Rietveld; mathematical aspects of Rietveld refinement, E. Prince; the flow of radiation in a polycrystalline material, T.M. Sabine; data collection strategies - fitting the experiment to the need, R.J. Hill; background modelling in Rietveld analysis, J.W. Richardson Jr; analytical profile fitting of X-ray powder diffraction profiles in Rietveld analysis, R.L. Snyder; crystal imperfection broadening and peak shape in the Rietveld method, R. Delhez, et al; Bragg reflection profile shape in X-ray powder diffraction patterns, P. Suortti; restraints and constraints in Rietveld refinement, C.B. Barlocher; Rietveld refinement with time-of-flight powder diffraction from pulsed neutron sources, W.I.F. David et al; combined X-ray and neutron Rietveld refinement, R.B. von Dreele; Rietveld analysis programmes Rietan and Premos and special applications, F. Izumi; position-constrained and unconstrained powder-pattern-decomposition methods H. Toraya; ab initio structure solutions with powder diffraction data, A.K. Cheetham.
| Erscheint lt. Verlag | 1.4.1993 |
|---|---|
| Reihe/Serie | International Union of Crystallography - Monographs on Crystallography ; No. 5 |
| Zusatzinfo | 87 line drawings, bibliography |
| Verlagsort | Oxford |
| Sprache | englisch |
| Maße | 156 x 234 mm |
| Gewicht | 630 g |
| Themenwelt | Naturwissenschaften ► Chemie ► Physikalische Chemie |
| Naturwissenschaften ► Geowissenschaften ► Mineralogie / Paläontologie | |
| Naturwissenschaften ► Physik / Astronomie ► Plasmaphysik | |
| Technik ► Maschinenbau | |
| ISBN-10 | 0-19-855577-6 / 0198555776 |
| ISBN-13 | 978-0-19-855577-3 / 9780198555773 |
| Zustand | Neuware |
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