VLSI-SoC: Design for Reliability, Security, and Low Power

23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers

Youngsoo Shin, Chi Ying Tsui, Jae-Joon Kim, Kiyoung Choi, Ricardo Reis (Herausgeber)

Buch | Hardcover

XIII, 223 Seiten

2016 | 1st ed. 2016
Springer International Publishing (Verlag)
978-3-319-46096-3 (ISBN)

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This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems.

Erscheinungsdatum	08.10.2016
Reihe/Serie	IFIP Advances in Information and Communication Technology
Zusatzinfo	XIII, 223 p. 121 illus.
Verlagsort	Cham
Sprache	englisch
Maße	155 x 235 mm
Themenwelt	Mathematik / Informatik ► Informatik ► Netzwerke
	Informatik ► Weitere Themen ► CAD-Programme
	Informatik ► Weitere Themen ► Hardware
	Technik ► Elektrotechnik / Energietechnik
Schlagworte	Applications • Chip integration • Computer-Aided Design (CAD) • Computer Architecture • Computer networking and communications • Computer Science • Computer Systems Organization and Communication Ne • conference proceedings • Field-programmable gate array (FPGA) • Hardware • Informatics • Logic Design • Low Power • Microprocessor chips • Research • security • sensors • Signal Processing • System on chip (SoC) • Systems Design • Very Large Scale Integration • VLSI circuits • wireless networks
ISBN-10	3-319-46096-X / 331946096X
ISBN-13	978-3-319-46096-3 / 9783319460963
Zustand	Neuware