Control of Semiconductor Interfaces

Proceedings of the First International Symposium, Karuizawa, Japan, 8-12 November 1993

I. Ohdomari, M. Oshima, A. Hiraki (Herausgeber)

Buch | Hardcover

600 Seiten

1994
Elsevier Science Ltd (Verlag)
978-0-444-81889-8 (ISBN)

Infos

These proceedings contain a selection of papers presented at a symposium on semiconductor interfaces. Topics covered include metal/silicon, semiconductor hetero-interface, characterization, semiconducting new materials, control of interface properties and contact metallization.

Inhalt

Plenary; metal/silicon; semiconductor hetero-interface; characterization (I); semiconducting new materials; metal/compound semiconductor; SiO2/Si; characterization (II); insulator/semiconductor; characterization (III); interface in device; control of interface formation - Si; control of interface properties - Si; contact metallization - Si; characterization - Si; control of interface formation - compound semiconductors; control of interface properties - compound semiconductors; contact metallization - compound semiconductors; characterization - compound semiconductors. (Part contents).

Produkt-Details

• Erscheint lt. Verlag: 31.5.1994
• Zusatzinfo: index
• Verlagsort: Oxford
• Sprache: englisch
• Themenwelt: Technik ► Elektrotechnik / Energietechnik
• ISBN-10: 0-444-81889-8 / 0444818898
• ISBN-13: 978-0-444-81889-8 / 9780444818898
• Zustand: Neuware