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Metrology and Physical Mechanisms in New Generation Ionic Devices

Umberto Celano (Autor)

Buch | Hardcover

XXIV, 175 Seiten

2016 | 1st ed. 2016
Springer International Publishing (Verlag)
978-3-319-39530-2 (ISBN)

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This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.

Umberto Celano received a M.Sc. degree in Nanoelectronics from the University of Rome ``Sapienza'', Italy and a Ph.D. degree in Physics from the KU Leuven, Belgium in 2011 and 2015 respectively. Currently, he is a researcher in the material and component analysis group of imec in Belgium. Umberto's research interests include nanometer scale issues in materials, emerging nanoelectronics and physical characterization. His goal is to explore methods and novel metrology techniques that enable the understanding of the physics in nanomaterials and nanoelectronics devices.

Introduction.- Filamentary-Based Resistive Switching.- Nanoscaled Electrical Characterization.- Conductive Filaments: Formation, Observation and Manipulation.- Three-Dimensional Filament Observation.- Reliability Threats in CBRAM.- Conclusions and Outlook.

Erscheinungsdatum	08.10.2016
Reihe/Serie	Springer Theses
Zusatzinfo	XXIV, 175 p. 96 illus., 18 illus. in color.
Verlagsort	Cham
Sprache	englisch
Maße	155 x 235 mm
Themenwelt	Naturwissenschaften ► Chemie ► Analytische Chemie
	Naturwissenschaften ► Chemie ► Physikalische Chemie
	Naturwissenschaften ► Physik / Astronomie
	Technik ► Elektrotechnik / Energietechnik
	Technik ► Maschinenbau
Schlagworte	3D metrology • AFM Tomography • C-AFM • Characterization and Evaluation of Materials • Conductive Bridging Memory CBRAM • Conductive Filaments • Ionic Devices • Nanotechnology and Microengineering • Physics and Astronomy • Resistive Switching • RRAM • Scalpel SPM • Spectroscopy and Microscopy
ISBN-10	3-319-39530-0 / 3319395300
ISBN-13	978-3-319-39530-2 / 9783319395302
Zustand	Neuware