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Development of a reference database for ion beam analysis

Buch | Softcover
226 Seiten
2015
IAEA (Verlag)
978-92-0-110515-8 (ISBN)
CHF 27,85 inkl. MwSt
Ion beam analysis techniques are non-destructive analytical techniques used to identify the composition and provide elemental depth profiles in surface layers of materials. Their reliability and accuracy depends on our knowledge of the nuclear reaction cross sections. This publication describes the coordinated effort to measure, compile and evaluate cross section data relevant to these techniques.
Ion beam analysis techniques are non-destructive analytical techniques used to identify the composition and provide elemental depth profiles in surface layers of materials. The applications of such techniques are diverse and include environmental control, cultural heritage and conservation and fusion technologies. Their reliability and accuracy depends strongly on our knowledge of the nuclear reaction cross sections, and this publication describes the coordinated effort to measure, compile and evaluate cross section data relevant to these techniques and make these data available to the user community through a comprehensive online database. It includes detailed assessments of experimental cross sections as well as attempts to benchmark these data against appropriate integral measurements.
Erscheinungsdatum
Reihe/Serie IAEA-TECDOC Series ; 1780
Zusatzinfo col. ill. figs, tables
Verlagsort Vienna
Sprache englisch
Themenwelt Schulbuch / Wörterbuch
Naturwissenschaften Biologie Ökologie / Naturschutz
Technik Elektrotechnik / Energietechnik
ISBN-10 92-0-110515-0 / 9201105150
ISBN-13 978-92-0-110515-8 / 9789201105158
Zustand Neuware
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