Atom Probe Tomography
Academic Press Inc (Verlag)
978-0-12-804647-0 (ISBN)
For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen—one of the leading scientific research centers exploring the various aspects of the instrument—will further enhance understanding and the learning process.
Williams Lefebvre, Ph.D., is Associate Professor, Materials Physics Group, University of Rouen, France. He received his Ph.D. in Materials Science in Rouen in 2001 for his correlative analysis by transmission electron microscopy and atom probe tomography (APT) of phase transformations in titanium aluminides. He earned a fellowship to the Japan Society for the promotion of science in 2002, when he visited the NIMS of Tsukuba. Since 2014, he has also been a visiting adjunct research associate professor at the University of Nebraska, Lincoln, USA, where has has been leading research activities in the field of physical metallurgy, focusing on light alloys systems, aiming at improving the methodology associated with the investigation of early stages of precipitation by APT and scanning transmission electron microscopy. Francois Vurpillot, Ph.D., has been Assistant Professor, Materials Physics Group (GPM), University of Rouen, France since 2003. After receiving his Ph.D. at the GPM in 2001, he spent one year at the Department of Materials at the University of Oxford, as a post-doctoral researcher funded by a Marie Curie fellowship support. He is the current vice-president of the International Field Emission Society (IFES) and leader of the Instrumentation team at the GPM. Francois Vurpillot pioneered the combination of experimental and simulated data in APT, which has been a breakthrough in the development of the technique for the nano analysis in material science. Xavier Sauvage, Ph.D., Senior Scientist, Materials Physics Group, University of Rouen, France defended his Ph.D. at the University of Rouen in 2001. The topic was utilizing Atom Probe Tomography (APT) in the investigation of phase transformations in nanoscaled composites processed by severe plastic deformation. After a post-doc position at the Max Planck Institut of Stuttgart, he was hired as research scientist at the Materials Physics Group, University of Rouen to lead some research on nanostructured materials. Dr. Sauvage is now leader of the Materials under Extreme Nanostructures and Energy research team, in which atomic scale microscopy techniques are used for the investigation of fundamental mechanisms in materials under extreme conditions like irradiation or severe plastic deformation.
Introduction
Chapter 1. Atom Probe Fundamentals
Chapter 2. Field Ion Emission Mechanisms
Chapter 3. Field Ion Microscopy
Chapter 4. Specimen Preparation by Focused Ion Beam
Chapter 5. Time of Flight Mass Spectrometry and Composition Measurements
Chapter 6. Atom Probe Tomography Detectors
Chapter 7. 3D Reconstructions
Chapter 8. Laser Assisted Field Evaporation
Chapter 9. Data Mining
Chapter 10. Correlative Microscopy by APT and (S)TEM
Chapter 11. Combining APT and Spectroscopy
Conclusion
Appendix
Index
| Erscheinungsdatum | 11.06.2016 |
|---|---|
| Verlagsort | San Diego |
| Sprache | englisch |
| Maße | 152 x 229 mm |
| Gewicht | 770 g |
| Themenwelt | Technik ► Maschinenbau |
| ISBN-10 | 0-12-804647-3 / 0128046473 |
| ISBN-13 | 978-0-12-804647-0 / 9780128046470 |
| Zustand | Neuware |
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