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Computer Simulation Tools for X-ray Analysis

Scattering and Diffraction Methods

Sérgio Luiz Morelhão (Autor)

Buch | Hardcover

XV, 294 Seiten

2015 | 1st ed. 2016
Springer International Publishing (Verlag)
978-3-319-19553-7 (ISBN)

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This book teaches the users on how to construct a library of routines to simulate scattering and diffraction by almost any kind of samples. The main goal of this book is to break down the huge barrier of difficulties faced by beginners from many fields (Engineering, Physics, Chemistry, Biology, Medicine, Material Science, etc.) in using X-rays as an analytical tool in their research. Besides fundamental concepts, MatLab routines are provided, showing how to test and implement the concepts. The major difficult in analysing materials by X-ray techniques is that it strongly depends on simulation software. This book teaches the users on how to construct a library of routines to simulate scattering and diffraction by almost any kind of samples. It provides to a young student the knowledge that would take more than 20 years to acquire by working on X-rays and relying on the available textbooks. The scientific productivity worldwide is growing at a breakneck pace, demanding ever more dynamic approaches and synergies between different fields of knowledge. To master the fundamentals of X-ray physics means the opportunity of working at an infiniteness of fields, studying systems where the organizational understanding of matter at the atomic scale is necessary. Since the discovery of X radiation, its usage as investigative tool has always been under fast expansion afforded by instrumental advances and computational resources. Developments in medical and technological fields have, as one of the master girders, the feasibility of structural analysis offered by X-rays. One of the major difficulties faced by beginners in using this fantastic tool lies in the analysis of experimental data. There are only few cases where it is possible to extract structural information directly from experiments. In most cases, structure models and simulation of radiation-matter interaction processes are essential. The advent of intense radiation sources and rapid development of nanotechnologyconstantly creates challenges that seek solutions beyond those offered by standard X-ray techniques. Preparing new researchers for this scenario of rapid and drastic changes requires more than just teaching theories of physical phenomena. It also requires teaching of how to implement them in a simple and efficient manner. In this book, fundamental concepts in applied X-ray physics are demonstrated through available computer simulation tools. Using MatLab, more than eighty routines are developed for solving the proposed exercises, most of which can be directly used in experimental data analysis. Therefore, besides X-ray physics, this book offers a practical programming course in modern high-level language, with plenty of graphic and mathematical tools.

Prof. Dr. Sérgio Luiz Morelhão received his PhD in Applied Physics from University of Campinas (UNICAMP), Brazil, in 1994 (highlight: theoretical framework and applications of hybrid reflections of X-rays in semiconductor devices). Postdoc in Material Science and Engineering at Carnegie Mellon University, USA, in 1996 (highlight: X-ray topography for understanding the rule of dislocation reactions in silicon solar cells grown from dendritic seeds). Postdoc in synchrotron radiation at the Brazilian Synchrotron Laboratory in 1996/1997 (building of the 1st X-ray diffraction beam line). Faculty at University of São Paulo since 1997 (highlights: theory and experiments for solving the phase problem in X-ray crystallography; application of phase contrast X-ray imaging for studying eye cataract disease; and advanced methods for characterizing nanostructured devices. He is author of more than 50 research papers on X-rays, most of which as the leading author.

Radiation-electron (free electron) elementary interaction.- Scattering of X-rays by distributions of free electrons.- Atoms and molecules.- X-ray absorption.- Low correlated systems: gases and dilute solutions.- Complex systems I: short-range correlations.- Complex systems II: arbitrary long-range correlations.- Crystals.- Application of kinematic diffraction.- Introduction to dynamical diffraction.

Erscheint lt. Verlag	14.10.2015
Reihe/Serie	Graduate Texts in Physics
Zusatzinfo	XV, 294 p.
Verlagsort	Cham
Sprache	englisch
Maße	155 x 235 mm
Themenwelt	Naturwissenschaften ► Chemie ► Physikalische Chemie
	Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik
	Naturwissenschaften ► Physik / Astronomie ► Festkörperphysik
	Technik ► Maschinenbau
Schlagworte	Characterization of Nanostructures • Coherent and Incoherent Scattering • Dynamical Diffraction of X-rays • Linear Absorption Coefficient • Materials Analysis by X-rays • Simulation of X-ray Diffraction • Simulation of X-ray Scattering • Structure Determination of Crystals • X-ray Analysis of Complex Systems • X-rays in Biophysics
ISBN-10	3-319-19553-0 / 3319195530
ISBN-13	978-3-319-19553-7 / 9783319195537
Zustand	Neuware