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Noise In Physical Systems And 1/f Fluctuations: Icnf 2001, Procs Of The 16th Intl Conf -

Noise In Physical Systems And 1/f Fluctuations: Icnf 2001, Procs Of The 16th Intl Conf

Gijs Bosman (Herausgeber)

Buch | Hardcover
848 Seiten
2001
World Scientific Publishing Co Pte Ltd (Verlag)
978-981-02-4677-8 (ISBN)
CHF 469,95 inkl. MwSt
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INCF 2001 brought together physicists and engineers interested in all aspects of noise and fluctuations in materials, devices, circuits, and physical and biological systems. These proceedings provide the reader with a comprehensive treatment of present noise research activities worldwide.
The International Conference on Noise in Physical Systems and 1/f Fluctuations brings together physicists and engineers interested in all aspects of noise and fluctuations in materials, devices, circuits, and physical and biological systems. The experimental research on novel devices and systems and the theoretical studies included in this volume provide the reader with a comprehensive, in-depth treatment of present noise research activities worldwide.

Noise in nanoscale devices, S. Bandyopadhyay et al; 1/f voltage noise induced by magnetic flux flow in granular superconductors, O.V. Gerashchenko; low-frequency noise analysis of different types of polysilicon resistors, A. Penarier et al; low-frequency noise in CMOS transistors - an experimental and comparative study on different technologies, P. Fantini et al; modelling of current transport and 1/f noise in GaN based HBTs (H Unlu); low-frequency noise in CdSe thin film transistors, M.J. Deen and S. Rumyanstsev; NIST program on relative intensity noise standards for optical fibre sources near 1550 nm, G. Obarski; physical model of the current noise spectral density versus dark current in CdTe detectors, A. Imad et al; time and frequency study of RTS in bipolar transistors, A. Penarier et al; neural network-based adaptive processing of electrogastrogram, S. Selvan; shot noise as a test of entanglement and nonlocality of electrons in mesoscopic systems, E.V. Sukhorukov et al; the readout of time, continued fractions and 1/f noise, M. Planat and J. Cresson; longitudinal and transverse noise of hot electrons in 2DEG channels, J. Liberis et al; 1/f noise, intermittency and clustering poisson process, F. Gruneis; noise modelling for PDE-based device simulations, F. Bonani and G. Ghione; methods of slope estimation of noise power spectral density, J. Smulko; and other papers.

Erscheint lt. Verlag 20.8.2001
Verlagsort Singapore
Sprache englisch
Themenwelt Naturwissenschaften Physik / Astronomie Mechanik
Technik Elektrotechnik / Energietechnik
Technik Maschinenbau
ISBN-10 981-02-4677-3 / 9810246773
ISBN-13 978-981-02-4677-8 / 9789810246778
Zustand Neuware
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