Microelectronic Systems N3 Checkbook (eBook)

R E Vears (Autor)

eBook Download: PDF

2014 | 1. Auflage
286 Seiten
Elsevier Science (Verlag)
978-1-4832-7993-0 (ISBN)

Infos

Microelectronic Systems N3 Checkbook, Level 3 provides further coverage of the Business and Technician Education Council (BTEC) unit in Microelectronic Systems N (syllabus U86/333), and aims to extend the range of hardware, software, and interfacing techniques developed at level NII. The book takes a look at microcomputer bus systems, interrupts, and logic families. Discussions focus on further and worked problems on logic families, worked problems on interrupts and microcomputer bus systems, and main points concerned with microcomputer bus systems. The text then ponders on semiconductor memories and interfacing devices. Topics include worked problems on interfacing devices, main points concerned with interfacing devices and semiconductor memories, and further problems on semiconductor memories. The text reviews signal degradation and assembly language problems, including main points concerned with signal degradation and assembly language programs and worked problems on assembly language programs and signal degradation. The book is a valuable source of data for researchers interested in microelectronic systems.

Inhalt

Front Cover 1
Microelectronic Systems N3 Checkbook 4
Copyright Page 5
Table of Contents 6
Notes to readers 7
Preface 8
Chapter 1. Microcomputer bus systems 10
A MAIN POINTS CONCERNED WITH MICROCOMPUTER BUS SYSTEMS 10
B WORKED PROBLEMS ON MICROCOMPUTER BUS SYSTEMS 19
C FURTHER PROBLEMS ON MICROCOMPUTER BUS SYSTEMS 43
Chapter 2. Interrupts 49
A MAIN POINTS CONCERNED WITH INTERRUPTS 49
B WORKED PROBLEMS ON INTERRUPTS 51
C FURTHER PROBLEMS ON INTERRUPTS 107
Chapter 3. Logic families 112
A MAIN POINTS CONCERNED WITH LOGIC FAMILIES 112
B WORKED PROBLEMS ON LOGIC FAMILIES 116
C FURTHER PROBLEMS ON LOGIC FAMILIES 143
Chapter 4. Semiconductor memories 146
A MAIN POINTS CONCERNED WITH SEMICONDUCTOR MEMORIES 146
B WORKED PROBLEMS ON SEMICONDUCTOR MEMORIES 148
C FURTHER PROBLEMS ON SEMICONDUCTOR MEMORIES 166
Chapter 5. Interfacing devices 168
A MAIN POINTS CONCERNED WJTH INTERFACING DEVICES 168
B WORKED PROBLEMS ON INTERFACING DEVICES 174
C FURTHER PROBLEMS ON INTERFACING DEVICES 226
Chapter 6. Assembly language programs 229
A MAIN POINTS CONCERNED WITH ASSEMBLY LANGUAGE PROGRAMS 229
B WORKED PROBLEMS ON ASSEMBLY LANGUAGE PROGRAMS 232
C FURTHER PROBLEMS ON ASSEMBLY LANGUAGE PROGRAMS 255
Chapter 7. Signal degradation 258
A MAIN POINTS CONCERNED WITH SIGNAL DEGRADATION 258
B WORKED PROBLEMS ON SIGNAL DEGRADATION 262
C FURTHER PROBLEMS ON SIGNAL DEGRADATION 268
Appendix: Instruction sets for the 6502, Z80 and 6800 microprocessors 269
Index 285

Produkt-Details

• Erscheint lt. Verlag: 12.5.2014
• Sprache: englisch
• Themenwelt: Technik ► Bauwesen
• Themenwelt: Technik ► Maschinenbau
• ISBN-10: 1-4832-7993-6 / 1483279936
• ISBN-13: 978-1-4832-7993-0 / 9781483279930