Secondary Ion Mass Spectrometry (eBook)

An Introduction to Principles and Practices

Paul van der Heide (Autor)

eBook Download: EPUB

2014 | 1. Auflage
384 Seiten
Wiley (Verlag)
978-1-118-91677-3 (ISBN)

Infos

Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS) Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS) Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other

Autor

Paul van der Heide is a recognized leader in surface analysis with emphasis on the application of Secondary Ion Mass Spectrometry (SIMS). This interest started during his PhD (completed in 1992 at the University of Auckland) which involved the design and construction of a magnetic sector SIMS instrument. Paul has since been heavily involved in the application and development of SIMS at the University of Western Ontario, the University of Houston (where he also filled in various Professor level positions), Samsung Austin Semiconductor, and most recently at GlobalFoundries (NY). Paul has ~100 publications with this representing his 2nd book.

Inhalt

Forward x

Preface xi

Acknowledgements xiv

List of physical constants xiv

Chapter 1: Introduction

1.1 Matter and the Mass Spectrometer

1.2 Secondary Ion Mass Spectrometry

1.3 Summary

Section I

Chapter 2: Properties of atoms, ions, molecules and solids

2.1 The Atom

2.2 Electronic structure of atoms and ions

2.3 Summary

Chapter 3: Current understanding of sputtering and ion formation

3.1 The fundamentals of SIMS

3.2 Sputtering

3.3 Ionization/neutralization

3.4 Summary

Section II

Chapter 4: Instrumentation

4.1 The science of measurement

4.2 Hardware

4.3 Summary

Chapter 5: Data collection

5.1 The art of measurement

5.2 Sample preparation and handling

5.3 Data collection

5.4 Data conversion

5.5 Summary

Appendix

i) Periodic table of the elements

ii) Isotope masses, natural isotope abundances, atomic weights and mass densities of the elements

iii) 1st and 2nd Ionization potentials and electron affinities of the elements

iv) Work-functions of elemental solids

v) SIMS detection limits of selected elements

vi) Charged particle beam transport

vii) Statistical properties

viii) SIMS instrument designs

ix) Additional SIMS methods of interest

x) Additional spectrometric/spectroscopic techniques

xi) Additional microscopic techniques

xii) Diffraction / reflection techniques

Technique acronym list

Abbreviations commonly used in SIMS

Glossary of terms

Questions and answers

References

Index

Notes

Rezensionen

"It is well worth owning if you want to learn about this exciting surface science technique for studying materials." (IEEE Electrical Engineering magazine, 1 May 2015)

"The entire book, and especially the second part, is a good reference work for users of D-SIMS and S-SIMS and for those working in other methods in analytical chemistry and the applied scientific fields, including the biosciences, where SIMS is now becoming a major experimental method." (Anal Bioanal Chem, 21 February 2015)

Produkt-Details

• Erscheint lt. Verlag: 19.8.2014
• Sprache: englisch
• Themenwelt: Naturwissenschaften ► Chemie ► Analytische Chemie
• Themenwelt: Technik
• Schlagworte: Analytical Chemistry • Analytische Chemie • Chemie • Chemistry • Dünne Schichten, Oberflächen u. Grenzflächen • Dünne Schichten, Oberflächen u. Grenzflächen • Electrical & Electronics Engineering • Elektrotechnik u. Elektronik • Halbleiter • Massenspektrometrie • Materials Science • Materialwissenschaften • semiconductors • Thin Films, Surfaces & Interfaces
• ISBN-10: 1-118-91677-8 / 1118916778
• ISBN-13: 978-1-118-91677-3 / 9781118916773