Electron Probe Quantitation
Springer-Verlag New York Inc.
978-1-4899-2619-7 (ISBN)
Early Times of Electron Microprobe Analysis.- Strategies of Electron Probe Data Reduction.- An EPMA Correction Method Based upon a Quadrilateral ?(?z) Profile.- Quantitative Analysis of Homogeneous or Stratified Microvolumes Applying the Model “PAP”.- ?(?z) Equations for Quantitative Analysis.- A Comprehensive Theory of Electron Probe Microanalysis.- A Flexible and Complete Monte Carlo Procedure for the Study of the Choice of Parameters.- Quantitative Electron Probe Microanalysis of Ultra-Light Elements (Boron-Oxygen).- Nonconductive Specimens in the Electron Probe Microanalyzer — A Hitherto Poorly Discussed Problem.- The R Factor: The X-Ray Loss due to Electron Backscatter.- The Use of Tracer Experiments and Monte Carlo Calculations in the ?(?z) Determination for Electron Probe Microanalysis.- Effect of Coster-Kronig Transitions on X-Ray Generation.- Uncertainties in the Analysis of M X-Ray Lines of the Rare-Earth Elements.- Standards for Electron Probe Microanalysis.- Quantitative Elemental Analysis of Individual Microparticles with Electron Beam Instruments.- The f(?) Machine: An Experimental Bench for the Measurement of Electron Probe Parameters.- Quantitative Compositional Mapping with the Electron Probe Microanalyzer.- Quantitative X-Ray Microanalysis in the Analytical Electron Microscope.
Zusatzinfo | VIII, 400 p. |
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Verlagsort | New York |
Sprache | englisch |
Maße | 155 x 235 mm |
Themenwelt | Naturwissenschaften ► Biologie ► Allgemeines / Lexika |
Naturwissenschaften ► Physik / Astronomie ► Angewandte Physik | |
Technik ► Maschinenbau | |
ISBN-10 | 1-4899-2619-4 / 1489926194 |
ISBN-13 | 978-1-4899-2619-7 / 9781489926197 |
Zustand | Neuware |
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