Electrical Overstress (EOS) (eBook)

Devices, Circuits and Systems

Steven H. Voldman (Autor)

eBook Download: PDF | EPUB

2013 | 1. Auflage
368 Seiten
John Wiley & Sons (Verlag)
978-1-118-70334-2 (ISBN)

Infos

Electrical Overstress (EOS) continues to impact semiconductor
manufacturing, semiconductor components and systems as technologies
scale from micro- to nano-electronics. This bookteaches the
fundamentals of electrical overstress and how to minimize and
mitigate EOS failures. The text provides a clear picture of EOS
phenomena, EOS origins, EOS sources, EOS physics, EOS failure
mechanisms, and EOS on-chip and system design. It provides an
illuminating insight into the sources of EOS in manufacturing,
integration of on-chip, and system level EOS protection networks,
followed by examples in specific technologies, circuits, and chips.
The book is unique in covering the EOS manufacturing issues from
on-chip design and electronic design automation to factory-level
EOS program management in today's modern world.

Look inside for extensive coverage on:

* Fundamentals of electrical overstress, from EOS physics,
EOS time scales, safe operating area (SOA), to physical
models for EOS phenomena

* EOS sources in today's semiconductor manufacturing
environment, and EOS program management, handling and EOS auditing
processing to avoid EOS failures

* EOS failures in both semiconductor devices, circuits and
system

* Discussion of how to distinguish between EOS events, and
electrostatic discharge (ESD) events (e.g. such as human body model
(HBM), charged device model (CDM), cable discharge events (CDM),
charged board events (CBE), to system level IEC 61000-4-2 test
events)

* EOS protection on-chip design practices and how they
differ from ESD protection networks and solutions

* Discussion of EOS system level concerns in printed circuit
boards (PCB), and manufacturing equipment

* Examples of EOS issues in state-of-the-art digital, analog and
power technologies including CMOS, LDMOS, and BCD

* EOS design rule checking (DRC), LVS, and ERC electronic design
automation (EDA) and how it is distinct from ESD EDA systems

* EOS testing and qualification techniques, and

* Practical off-chip ESD protection and system level solutions to
provide more robust systems

Electrical Overstress (EOS): Devices, Circuits and
Systems is a continuation of the author's series of books
on ESD protection. It is an essential reference and a useful
insight into the issues that confront modern technology as we enter
the nano-electronic era.

Autor

Steven H . Voldman , IEEE Fellow, Vermont, USA

Produkt-Details

• Erscheint lt. Verlag: 27.8.2013
• Sprache: englisch
• Themenwelt: Technik ► Elektrotechnik / Energietechnik
• Schlagworte: Circuit Theory & Design • Electrical & Electronics Engineering • Electromagnetic Compatibility • Electromagnetic theory • Elektromagnetische Verträglichkeit • Elektromagnetische Verträglichkeit • Elektromagnetismus • Elektrotechnik • Elektrotechnik u. Elektronik • Schaltkreise - Theorie u. Entwurf
• ISBN-10: 1-118-70334-0 / 1118703340
• ISBN-13: 978-1-118-70334-2 / 9781118703342