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Transmission Electron Microscopy Characterization of Nanomaterials

Challa S.S.R. Kumar (Herausgeber)

Buch | Hardcover
IX, 717 Seiten
2013 | 2014
Springer Berlin (Verlag)
978-3-642-38933-7 (ISBN)
CHF 299,55 inkl. MwSt
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Covering modern applications and state-of-the-art techniques, this handbook offers a comprehensive overview on transmission electron microscopy characterization of nanomaterials. It is the third title in a 40-volume series on nanoscience and nanotechnology.
Third volume of a 40volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Transmission electron microscopy characterization of nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.

Dr. Challa S. S. R. Kumar is Director of Nanofabrication and Nanomaterials at the Center for Advanced Microstructures and Devices at Louisiana State University in Baton Rouge, USA. He is also President and CEO of Magnano Technologies and has some years of industrial R&D experience working for Imperial Chemical Industries and United Breweries. His main research interests are the development of novel synthetic methods, including those based on microfluidic reactors, for the synthesis of multifunctional nanomaterials. Dr. Kumar is the winner of the 2006 Nano 50 Technology Award for his work in magnetic-based nanoparticles for cancer imaging and treatment. He is the editor and author of several books and journal articles, and a former editor of the Journal of Biomedical Nanotechnology.

TEM Characterization of Biological and Inorganic Nanocomposites.- Electron Microscopy of Thin Film Inorganic and Organic Photovoltaic Materials.- TEM for Characterization of Semiconductor Nanomaterials.- Study of Polymeric Nano-Composites by 3D-TEM and Related Techniques.-TEM for Characterization of Nanowires and Nanorods.- TEM for Characterization of Core-Shell Nanomaterials.- Valence Electron Spectroscopy by Transmission Electron Microscopy.- TEM Characterization of Nanocomposite Materials.- High Resolution in STEM Mode: Individual Atom Analysis in Semiconductor Nanowires.- Electron Microscopy for Characterization of Thermoelectric Nanomaterials.- TEM for Characterization of Nanocomposites Oxide Thin Films: A Case Study on Solution-Derived Lanthanum Strontium Manganites.- TEM Characterization of Metallic Nanocatalysts.- 3D Electron Microscopy Applied to Nanoscience.-Transmission Electron Microscopy of 1D-Nanostructures

Erscheint lt. Verlag 27.12.2013
Zusatzinfo IX, 717 p. 402 illus., 264 illus. in color.
Verlagsort Berlin
Sprache englisch
Maße 155 x 235 mm
Gewicht 1250 g
Themenwelt Naturwissenschaften Chemie
Naturwissenschaften Physik / Astronomie Allgemeines / Lexika
Technik Maschinenbau
ISBN-10 3-642-38933-3 / 3642389333
ISBN-13 978-3-642-38933-7 / 9783642389337
Zustand Neuware
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