Boundary-Scan Test

A Practical Approach

Harry Bleeker, Peter van den Eijnden, Frans De Jong (Autoren)

Buch | Softcover

225 Seiten

2012 | Softcover reprint of the original 1st ed. 1993
Springer-Verlag New York Inc.
978-1-4613-6371-2 (ISBN)

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The ever-increasing miniaturization of digital electronic components is hampering the conventional testing of Printed Circuit Boards (PCBs) by means of bed-of-nails fixtures. Basically this is caused by the very high scale of integration of ICs, through which packages with hundreds of pins at very small pitches of down to a fraction of a millimetre, have become available. As a consequence the trace distances between the copper tracks on a printed circuit board cmne down to the same value. Not only the required small physical dimensions of the test nails have made conventional testing unfeasible, but also the complexity to provide test signals for the many hundreds of test nails has grown out of limits. Therefore a new board test methodology had to be invented. Following the evolution in the IC test technology. Boundary-Scan testing hm; become the new approach to PCB testing. By taking precautions in the design of the IC (design for testability), testing on PCB level can be simplified 10 a great extent. This condition has been essential for the success of the introduction of Boundary-Sc,m Test (BST) at board level.

1 PCB Testing.- Miniaturization in Electronics.- Road Blocks for Conventional PCB Test Methods.- The Solution for PCB Testing.- 2 The Boundary-Scan Test Standard.- The BST Architecture.- Test Access Port.- Tap Controller.- The Instruction Register.- Test Data Registers.- Instructions.- Documentation Requirements.- 3 Hardware Test Innovations.- Provisions at Board Level.- System-Level Test Support.- On Chip Provisions.- 4 BST Design Languages.- BSDL Description.- BSDL Design Example.- A Boundary-Scan Register Compiler.- Test Specification Languages.- 5 PCB Test Strategy Backgrounds.- Testing The Integrity of the BST Chain.- PCB Production Faults.- Test Algorithms.- Diagnostics.- Cluster Testing.- Architecture of a Boundary-Scan Test Flow.- 6 Management Aspects.- Coming to the Standard.- Management Role.- Benefits of Boundary-Scan Test.- References.

Zusatzinfo	XVI, 225 p.
Verlagsort	New York, NY
Sprache	englisch
Maße	155 x 235 mm
Themenwelt	Informatik ► Weitere Themen ► CAD-Programme
Themenwelt	Technik ► Elektrotechnik / Energietechnik
ISBN-10	1-4613-6371-3 / 1461363713
ISBN-13	978-1-4613-6371-2 / 9781461363712
Zustand	Neuware