Multiple Diffraction of X-Rays in Crystals
Springer Berlin (Verlag)
978-3-642-82168-4 (ISBN)
1. Introduction.- 2. Geometry, Peak Indexing, and Experimental Techniques.- 2.1 Geometry of Multiple Diffraction.- 2.2 Experimental Techniques for Obtaining Multiple Diffraction.- 2.3 Indexing Multiple Diffraction Patterns.- 2.4 Indexing Kossel Patterns.- 3. Kinematical Theory of Diffraction.- 3.1 Equation of Power Transfer for Multi-Beam Cases.- 3.2 Approximate Solutions to the Equation of Power Transfer.- 3.3 Integrated Intensity and the Lorentz-Polarization Factors.- 3.4 Path Lengths of X-Ray Beams in Crystals.- 3.5 Exact Solution to the Power-Transfer Equation.- 3.6 Iterative Calculation for Reflection Power.- 3.7 Dynamical Treatment for Kinematical Reflections.- 3.8 Diffraction in Multi-Layered Crystals.- 3.9 Peak Width, Beam Divergence, and Mosaic Spread.- 4. Dynamical Theory of X-Ray Diffraction.- 4.1 Fundamental Equation of Wavefields.- 4.2 Polarization of Wavefields.- 4.3 Dispersion Surface.- 4.4 Energy Flow.- 4.5 Modes of Wave Propagation.- 4.6 Absorption.- 4.7 Boundary Conditions.- 4.8 Excitation of Mode and Excitation of Beam.- 4.9 Intensity of Wavefield (Standing-Wave) in Crystal.- 4.10 Consideration of the Spherical-Wave Nature of the Incident X-Rays.- 5. Approximations, Numerical Computing, and Other Approaches.- 5.1 Two-Beam Approximation for Three-Beam Diffraction.- 5.2 Procedures for Numerical Computing.- 5.3 Quantum Mechanical Approach.- 5.4 N-Beam Diffraction in Other Types of Interaction.- 6. Case Studies.- 6.1 Bragg-Type Multiple Diffraction from Gallium Arsenide, Indium Arsenide and Indium Phosphide-Kinematical Interpretation.- 6.2 Three-Beam Borrmann Diffraction-Dynamical Calculation.- 6.3 Simultaneous Four-Beam Borrmann Diffraction.- 6.4 Three-Beam Bragg-Laue and Bragg-Bragg Diffraction.- 6.5 Four-Beam Bragg-Laue Diffraction.- 7.Applications.- 7.1 Experimental Determination of X-Ray Reflection Phases; Application to Crystal Structure Determination.- 7.2 Determination of Lattice Constants of Single Crystals.- 7.3 Determination of Lattice Mismatch in Thin Layered Materials.- 7.4 Multi-Beam X-Ray Topography.- 7.5 Multi-Beam X-Ray Interferometer.- 7.6 Monochromatization of X-Ray Beams.- 7.7 Plasma Diagnosis.- 7.8 Determination of Mosaic Spread of Crystals.- 7.9 Multi-Beam X-Ray Standing-Wave Excited Fluorescence Technique for Surface Studies-A Proposed Method.- 7.10 Possible Future Trend of Development.- References.
Erscheint lt. Verlag | 22.12.2011 |
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Reihe/Serie | Springer Series in Solid-State Sciences |
Zusatzinfo | XI, 300 p. |
Verlagsort | Berlin |
Sprache | englisch |
Maße | 155 x 235 mm |
Gewicht | 484 g |
Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik |
Naturwissenschaften ► Physik / Astronomie ► Festkörperphysik | |
Naturwissenschaften ► Physik / Astronomie ► Optik | |
Technik ► Maschinenbau | |
Schlagworte | Absorption • atoms • Crystal • crystals • crystal structure • Development • diffraction • Dispersion • Interferometer • Materials Science • Molecule • polarization • Structure • Transmission • X-Ray |
ISBN-10 | 3-642-82168-5 / 3642821685 |
ISBN-13 | 978-3-642-82168-4 / 9783642821684 |
Zustand | Neuware |
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