Advances in Imaging and Electron Physics
Academic Press Inc (Verlag)
978-0-12-394297-5 (ISBN)
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Derivation of the Reflection Equations for Higher Order Aberrations of Local Wavefronts by Oblique Incidence
G. Esser, W. Becken, W. Müller, P. Baumbach, J. Arasa, D. Uttenweiler
Thermal Imaging in Medicine
Lila Iznita Izhar and Maria Petrou
Derivation of the Radiative Transfer Equation in a Medium with a Spatially Varying Refractive Index: A Review
Jean-Michel Tualle
Imaging Mass Spectrometry – Sample Preparation, Instrumentation and Applications
Kamlesh Shrivas and Mitsutoshi Setou
Transformation Optics
Robert T. Thompson and Steven A. Cummer
TSEM - A Review of Scanning Electron Microscopy in Transmission Mode and Its Applications
Tobias Klein, Egbert Buhr and Carl Georg Frase
Logarithmic Image Processing: Additive Contrast, Multiplicative Contrast and Associated Metrics
M. Jourlina, M. Carr´e, J. Breugnot and M. Bouabdellah
| Reihe/Serie | Advances in Imaging and Electron Physics |
|---|---|
| Mitarbeit |
Herausgeber (Serie): Peter W. Hawkes |
| Verlagsort | San Diego |
| Sprache | englisch |
| Maße | 152 x 229 mm |
| Gewicht | 790 g |
| Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Angewandte Physik |
| Naturwissenschaften ► Physik / Astronomie ► Optik | |
| Technik ► Maschinenbau | |
| ISBN-10 | 0-12-394297-7 / 0123942977 |
| ISBN-13 | 978-0-12-394297-5 / 9780123942975 |
| Zustand | Neuware |
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