The Core Test Wrapper Handbook (eBook)

Rationale and Application of IEEE Std. 1500™

Francisco Da Silva, Teresa McLaurin, Tom Waayers (Autoren)

eBook Download: PDF

2006 | 2006
XXIX, 276 Seiten
Springer US (Verlag)
978-0-387-34609-0 (ISBN)

Infos

The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500tm provides insight into the rules and recommendations of IEEE Std. 1500. This book focuses on practical design considerations inherent to the application of IEEE Std. 1500 by discussing design choices and other decisions relevant to this IEEE standard. The authors provide background information about some of the choices and decisions made throughout the design of IEEE Std. 1500.

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In the early to mid-1990's while working at what was then Motorola Se- conductor, business changes forced my multi-hundred dollar microprocessor to become a tens-of-dollars embedded core. I ran into first hand the problem of trying to deliver what used to be a whole chip with something on the order of over 400 interconnect signals to a design team that was going to stuff it into a package with less than 220 signal pins and surround it with other logic. I also ran into the problem of delivering microprocessor specification verifi- tion - a microprocessor is not just about the functions and instructions included with the instruction set, but also the MIPs rating at some given f- quency. I faced two dilemmas: one, I could not deliver functional vectors without significant development of off-core logic to deal with the reduced chip I/O map (and everybody's I/O map was going to be a little different); and two, the JTAG (1149. 1) boundary scan ring that was around my core when it was a chip was going to be woefully inadequate since it did not support - speed signal application and capture and independent use separate from my core. I considered the problem at length and came up with my own solution that was predominantly a separate non-JTAG scan test wrapper that supported at-speed application of launch-capture cycles using the system clock. But my problems weren't over at that point either.

Inhalt

Contents 8
List of Figures 16
List of Tables 22
Foreword 24
Preface 28
Acknowledgements 30
Introduction 31
Chapter 1 What is the IEEE 1500 Standard? 33
1.1 The IEEE 1500 Wrapper Architecture 36
1.1.1 The Wrapper Interface Port 37
1.1.2 The 1500 Wrapper Instruction Register 38
1.1.3 The Wrapper Boundary Register 38
1.1.4 The Wrapper Bypass Register 39
1.2 Compliance to IEEE 1500 39
1.2.1 IEEE 1500 Unwrapped Compliance 39
1.2.2 IEEE 1500 Wrapped Compliance 40
1.3 The Core Test Language (CTL) 41
1.3.1 What is CTL? 41
Chapter 2 Why use the IEEE 1500 Standard? 43
2.1 Introduction 43
2.1.1 Test Reuse and Partitioning 43
2.1.2 Partition-Based Testing, Debug and Diagnosis 47
2.2 Why Was a Standard Needed? 48
Chapter 3 Illustration Example 51
3.1 Introduction 51
3.2 Unwrapped Core 51
3.3 Writing CTL For the EX Core 55
3.3.1 CTL Code Convention 55
3.3.2 CTL Code For the Unwrapped EX Core 55
Chapter 4 Design of the IEEE 1500 Interface Port 59
4.1 Creation of the Wrapper Interface Port 59
4.1.1 Creation of the WSP 59
4.1.2 Understanding the WPP 67
4.2 CTL Template for the Wrapper Interface Port 68
4.2.1 Structure of the CTL Internal block 70
4.3 Wrapper Interface Port Creation for the EX Core 79
4.3.1 Declaring WRCK for the EX wrapper in serial mode 83
4.3.2 Declaring WRSTN for the EX wrapper 84
4.3.3 Declaring SelectWIR for the EX Wrapper 85
4.3.4 Declaring ShiftWR for the EX Wrapper 85
4.3.5 Declaring CaptureWR for the EX wrapper 86
4.3.6 Declaring UpdateWR for the EX Wrapper 87
4.3.7 Declaring WSI for the EX Wrapper 88
4.3.8 Declaring WSO for the EX Wrapper 88
4.3.9 Declaring WPC for the EX Wrapper 89
4.3.10 Declaring WPI for the EX Wrapper 93
4.3.11 Declaring WPO for the EX Wrapper 95
4.4 Combined CTL Code for EX Wrapper Terminals 98
4.5 Plug-and-play of the 1500 Architecture 105
Chapter 5 Instruction Types 107
5.1 Overview of the IEEE 1500 Standard Instructions 107
5.1.1 Mandatory Instructions 109
5.1.2 Optional Instructions 113
5.1.3 User-Defined Instructions 118
5.2 EX Wrapped Core Instructions 119
5.3 CTL Template for 1500 Instructions 123
5.3.1 Describing Patterns in CTL 123
5.3.2 Accessing Information Outside the CTLMode Block Using the DomainReferences Keyword 128
5.3.3 Describing Test Modes Using the TestMode Keyword 129
5.3.4 Specifying Pattern Information for Test Modes Using the PatternInformation Keyword 130
5.3.5 Identifying IEEE 1500 Instructions Using the TestMode-ForWrapper Keyword 134
5.4 Combined 1500 Instructions CTL Code Template 134
5.5 Describing CTL Code for EX Wrapper Instructions 135
5.5.1 Describing WS_BYPASS in CTL for the EX Wrapper 136
5.5.2 Describing WP_BYPASS in CTL for the EX Core 141
5.5.3 Describing WS_EXTEST in CTL for the EX Core 143
5.5.4 Describing WP_INTEST in CTL for the EX core 145
5.5.5 Describing WS_INTEST in CTL for the EX Core 147
5.5.6 Describing WP_INTEST_MBIST in CTL for the EX core 149
5.5.7 Describing WP_EXTEST in CTL for the EX core 151
5.5.8 Describing WS_SAFE_SINGLE in CTL for the EX Core 153
5.5.9 Describing WP_EXTEST_SEQ in CTL for the EX Core 155
5.5.10 Describing WP_INTEST_SEQ in CTL for the EX core 157
Chapter 6 Design of the WBR 161
6.1 What is the WBR? 162
6.2 Provision of WBR cells 163
6.3 Creation of 1500 compliant WBR cells 164
6.3.1 WBR Cell operation 165
6.3.2 Dedicated WBR Cell implementation 170
6.3.3 Shared WBR Cell implementation 173
6.3.4 Harness Cells and Reduced Functionality Cells 175
6.4 Describing wrapper cells in 1500 176
6.4.1 Describing WBR cells 177
6.5 WBR Operation Events 181
6.5.1 WBR Operation Modes 182
6.5.2 Parallel configuration of the WBR 184
6.6 Creation of the WBR for the EX example 186
6.6.1 EX core test requirements 186
6.6.2 EX core WBR cell design 187
6.6.3 Shared WBR cell design 190
6.6.4 Special WBR cell design 192
6.6.5 WBR design 197
6.7 Describing the WBR in CTL 200
6.7.1 Describing WBR cells in CTL at a Wrapper Level 201
6.7.2 Describing WBR Cells in CTL at a Core Level 202
6.7.3 Describing Scan Chains in CTL 203
6.8 Describing the WBR chain of the EX wrapper in CTL 204
6.8.1 EX wrapper serial mode WBR chain 204
6.8.2 EX wrapper parallel mode WBR chains 205
6.9 Describing WBR Cells of the EX Wrapper in CTL 206
Chapter 7 Design of the WBY 211
7.1 Introduction 211
7.2 WBY Construction 211
7.3 WBY Utilization 214
7.4 WBY for the EX Core 215
7.5 Describing the WBY in CTL for the EX Core 215
Chapter 8 Design of the WIR 217
8.1 WIR architecture 217
8.1.1 WIR Operation 218
8.2 Understanding the WIR Rules 220
8.2.1 WIR Configuration and DR selection 220
8.2.2 Wrapper Disabled and Enabled States 221
8.2.3 WIR Design 221
8.3 Creation of the WIR for the EX example 226
8.3.1 Design of WIR building blocks 227
8.3.2 EX core WIR design 228
8.3.3 Design of WIR circuitry for 1500 register control 233
8.3.4 Design of WIR circuitry for register configuration 241
8.3.5 WIR circuitry for clock selection 245
8.4 Describing the WIR in CTL for the EX Core 246
Chapter 9 Hierarchical Cores 247
9.1 Dealing with Hierarchical Cores 247
9.2 WIR in a Hierarchical Core 248
9.3 WBY in a Hierarchical Core 248
9.4 WBR in a Hierarchical Core 250
Chapter 10 Finalizing the Wrapper Solution for the EX Core 251
10.1 Expressing Compliance to the 1500 Standard 251
10.1.1 Expressing 1500 compliance for the EX wrapper 252
10.2 The Wrapped Core 252
10.2.1 Wrapping the EX Core 252
10.3 Defining the wrapper reset operation in CTL 253
10.4 Pattern examples 255
10.4.1 WS_INTEST pattern example 255
10.4.2 WP_INTEST pattern example 257
10.5 Combined CTL Code for the EX Wrapper 259
Chapter 11 SOC Integration of 1500 Compliant Cores 279
11.1 SOC integration 279
11.1.1 1500 compliant wrapped core types. 279
11.1.2 Core connection types 281
11.1.3 Connecting 1500 compliant cores 283
11.1.4 Interfacing to SOC pins 287
11.2 TAP controller interface 291
11.2.1 Interfacing TAP FSM to WSC 292
11.2.2 Mapping TAP states to WIR events 294
11.2.3 Mapping TAP states to WBR cell events 296
11.3 Scheduling considerations 298
Conclusion 303
Index 305

Produkt-Details

• Erscheint lt. Verlag: 15.9.2006
• Reihe/Serie: Frontiers in Electronic Testing
• Reihe/Serie: Frontiers in Electronic Testing
• Zusatzinfo: XXIX, 276 p.
• Verlagsort: New York
• Sprache: englisch
• Themenwelt: Informatik ► Weitere Themen ► CAD-Programme
• Themenwelt: Technik ► Elektrotechnik / Energietechnik
• Schlagworte: Design • SoC • Standard • System on chip (SoC)
• ISBN-10: 0-387-34609-0 / 0387346090
• ISBN-13: 978-0-387-34609-0 / 9780387346090