Advances in Imaging and Electron Physics
Academic Press Inc (Verlag)
978-0-12-385983-9 (ISBN)
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
The synthesis of a Stochastic Artificial Neural Network application using a Genetic Algorithm approach
LucaGeretti, AntonioAbramo
Logarithmic Image Processing for Color Images
M. Jourlin, J. Breugnot, F. Itthirad, M. Bouabdellah, B. Closs
Current Technologies for High Speed and Functional Imaging with Optical Coherence Tomography
Rainer A. Leitgeb
Analysis of optical systems, contrast depth and measurement of electric and magnetic field distribution on the object’s surface in mirror electron microscopy
S.A. Nepijko, G. Schönhense
Multivariate statistics applications in scanning transmission electron microscopy X-ray spectrum imaging
Chad M. Parish
Aberration Correctors developed under Triple C Project
Hidetaka Sawada, Fumio Hosokawa, Takeo Sasaki, Toshikatsu Kaneyama, Yukihito Kondo, Kazutomo Suenaga
Spatially resolved thermoluminescence in a scanning electron microscope
T. Schulz, M. Albrecht, K.Irmscher
| Reihe/Serie | Advances in Imaging and Electron Physics |
|---|---|
| Mitarbeit |
Herausgeber (Serie): Peter W. Hawkes |
| Verlagsort | San Diego |
| Sprache | englisch |
| Maße | 152 x 229 mm |
| Gewicht | 680 g |
| Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Angewandte Physik |
| Naturwissenschaften ► Physik / Astronomie ► Hochenergiephysik / Teilchenphysik | |
| Technik | |
| ISBN-10 | 0-12-385983-2 / 0123859832 |
| ISBN-13 | 978-0-12-385983-9 / 9780123859839 |
| Zustand | Neuware |
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