Principles of Analytical Electron Microscopy

Joseph Goldstein, David C. Joy, Alton D. Romig Jr. (Herausgeber)

Buch | Hardcover

448 Seiten

1986 | 1986 ed.
Kluwer Academic/Plenum Publishers (Verlag)
978-0-306-42387-1 (ISBN)

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Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the "physics of the processes" and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.

1 Electron Beam-Specimen Interactions in the Analytical Electron Microscope.- 2 Introductory Electron Optics.- 3 Principles of Image Formation.- 4 Principles of X-Ray Energy-Dispersive Spectrometry in the Analytical Electron Microscope.- 5 Quantitative X-Ray Analysis.- 6 EDS Quantitation and Application to Biology.- 7 The Basic Principles of EELS.- 8 Quantitative Microanalysis Using EELS.- 9 Electron Microdiffraction.- 10 Barriers to AEM: Contamination and Etching.- 11 Radiation Effects Encountered by Inorganic Materials in Analytical Electron Microscopy.- 12 High-Resolution Microanalysis and Energy-Filtered Imaging in Biology.- 13 A Critique of the Continuum Normalization Method used for Biological X-Ray Microanalysis.

Zusatzinfo	XVI, 448 p.
Verlagsort	New York
Sprache	englisch
Maße	156 x 234 mm
Themenwelt	Naturwissenschaften ► Biologie ► Allgemeines / Lexika
	Naturwissenschaften ► Physik / Astronomie ► Angewandte Physik
	Technik ► Maschinenbau
ISBN-10	0-306-42387-1 / 0306423871
ISBN-13	978-0-306-42387-1 / 9780306423871
Zustand	Neuware