Optical Methods of Measurement

Wholefield Techniques

Rajpal Sirohi (Autor)

Rajpal Sirohi, Fook Siong Chau (Herausgeber)

Buch | Hardcover

328 Seiten

1999
Marcel Dekker Inc (Verlag)
978-0-8247-6003-8 (ISBN)

Infos

Offers an examination of optical measurement techniques employing laser, holographic and digital technology. This work analyzes the advanced non-invasive methods for measuring stationary or mobile objects and surfaces. It provides information on issues of reproducing extremely fine spatial resolution in two and three dimensions.

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Provides an examination of up-to-date optical measurement techniques employing laser, holographic and digital technology. The text analyzes the most advanced non-invasive methods for measuring stationary or mobile objects and surfaces. It provides information on practical and theoretical issues of reproducing extremely fine spatial resolution in two and three dimensions.

Inhalt

Waves; deffraction; phase evaluation methods; detectors and recording materials; holographic interferometry; speckle metrology; photoelasticity; the Moire phenomenon

Produkt-Details

• Erscheint lt. Verlag: 28.5.1999
• Reihe/Serie: Optical Science and Engineering
• Verlagsort: New York
• Sprache: englisch
• Maße: 216 x 279 mm
• Gewicht: 590 g
• Themenwelt: Technik ► Maschinenbau
• ISBN-10: 0-8247-6003-4 / 0824760034
• ISBN-13: 978-0-8247-6003-8 / 9780824760038
• Zustand: Neuware